A comparative study of X-ray absorption spectroscopy at various synchrotron facilities and the effect of transverse source coherence

被引：3

作者：

Dunn, JH ^{[1
]}

Arvanitis, D

Baberschke, K

Hahlin, A

Karis, O

Carr, R

Mårtensson, N

机构：

[1] Stanford Univ, Stanford Linear Accelerator Ctr, Stanford Synchrotron Radiat Lab, Stanford, CA 94309 USA

[2] Univ Uppsala, Dept Phys, S-75121 Uppsala, Sweden

来源：

JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2000年 / 113卷 / 01期

关键词：

D O I：

10.1016/S0368-2048(00)00223-1

中图分类号：

O433 [光谱学];

学科分类号：

0703 ; 070302 ;

摘要：

Core level X-ray Absorption Spectroscopy measurements have been performed at the L-3,L-2 edges of thin film Fe samples deposited on the (100) surface of Cu. Soft X-rays from five different beamlines have been used to measure spectra from identical samples with very different degrees of transverse coherence in the synchrotron radiation. The degree of source coherence has been characterised by diffraction. The transverse coherence length has been extracted and found to be on the mum length scale at certain beamlines. An increase of the L edge resonance intensities, relative to the continuum states, is observed in spectra measured at these beamlines. (C) 2000 Elsevier Science B.V. All rights reserved.

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页码：67 / 77

页数：11

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