Quantitative assessment of STM images of Fe grown epitaxially on MgO(001) using fractal techniques

被引：10

作者：

Jordan, SM ^{[1
]}

Schad, R ^{[1
]}

Herrmann, DJL ^{[1
]}

Lawler, JF ^{[1
]}

van Kempen, H ^{[1
]}

机构：

[1] Catholic Univ Nijmegen, Mat Res Inst, NL-6525 ED Nijmegen, Netherlands

来源：

PHYSICAL REVIEW B | 1998年 / 58卷 / 19期

关键词：

D O I：

10.1103/PhysRevB.58.13132

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We have assessed scanning tunneling microscope images of Fe grown on MgO(001) at various temperatures using two different methods. Evaluation of the height-height variance function reported a correlation length very close to the average island radius. The area-perimeter method reported the perimeters above which non-square-law scaling of the islands begins to be somewhat lower than the average perimeters of the discrete islands. A comparison of two common methods for evaluating length-dependent roughness is made. [S0163-1829(98)00143-X].

引用

页码：13132 / 13137

页数：6

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