A study of surface reactions during the growth of B-doped a-Si:H using the intermittent deposition technique

被引:3
作者
Kamei, T
Hata, N
Matsuda, A
机构
[1] Electrotechnical Laboratory, Tsukuba 305
关键词
D O I
10.1016/0022-3093(96)00021-X
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The intermittent deposition technique has been applied to the fabrication of B-doped a-Si:H. In this technique, growth and intermission processes (waiting time) are repeated in cycles by using a mechanical shutter, while continuously maintaining the discharge. The dark conductivities in B-doped films deposited at 150 and 200 degrees C increase with waiting time, accompanied by optical gap narrowing except when the waiting time is short. In gas exchange experiments, where B2H6 doped SiH4 is replaced by Ar during the waiting time, the conductivity of the film grown at 150 degrees C increases without the narrowing. The reactions determining the conductivity and optical gap during the waiting time are discussed.
引用
收藏
页码:999 / 1002
页数:4
相关论文
共 9 条
[1]   INSITU STUDY OF P-TYPE AMORPHOUS-SILICON GROWTH FROM B2H6 - SIH4 MIXTURES - SURFACE REACTIVITY AND INTERFACE EFFECTS [J].
COLLINS, RW .
APPLIED PHYSICS LETTERS, 1988, 53 (12) :1086-1088
[2]   DEFECT FORMATION DURING GROWTH OF HYDROGENATED AMORPHOUS-SILICON [J].
GANGULY, G ;
MATSUDA, A .
PHYSICAL REVIEW B, 1993, 47 (07) :3661-3670
[3]  
GANGULY G, 1994, MATER RES SOC SYMP P, V336, P7, DOI 10.1557/PROC-336-7
[4]   SPATIAL-DISTRIBUTION OF SIH3 RADICALS IN RF SILANE PLASMA [J].
ITABASHI, N ;
NISHIWAKI, N ;
MAGANE, M ;
NAITO, S ;
GOTO, T ;
MATSUDA, A ;
YAMADA, C ;
HIROTA, E .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1990, 29 (03) :L505-L507
[5]  
KAMEI T, 1994, MATER RES SOC SYMP P, V336, P31, DOI 10.1557/PROC-336-31
[6]  
KAMEI T, 1993, J NONCRYST SOLIDS, V164, P43
[7]   STICKING AND RECOMBINATION OF THE SIH3 RADICAL ON HYDROGENATED AMORPHOUS-SILICON - THE CATALYTIC EFFECT OF DIBORANE [J].
PERRIN, J ;
TAKEDA, Y ;
HIRANO, N ;
TAKEUCHI, Y ;
MATSUDA, A .
SURFACE SCIENCE, 1989, 210 (1-2) :114-128
[8]   INSITU CHARACTERIZATION OF THE GROWING A-SI-H SURFACE BY IR SPECTROSCOPY [J].
TOYOSHIMA, Y ;
ARAI, K ;
MATSUDA, A ;
TANAKA, K .
JOURNAL OF NON-CRYSTALLINE SOLIDS, 1991, 137 :765-770
[9]   ANOMALOUS OPTICAL AND STRUCTURAL-PROPERTIES OF B-DOPED A-SI-H [J].
YAMASAKI, S ;
MATSUDA, A ;
TANAKA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 1982, 21 (12) :L789-L791