Size effects on thin film ferroelectrics: Experiments on isolated single crystal sheets

被引:56
作者
Chang, L. W. [1 ]
McMillen, M. [1 ]
Morrison, F. D. [2 ]
Scott, J. F. [3 ]
Gregg, J. M. [1 ]
机构
[1] Queens Univ Belfast, Sch Maths & Phys, Ctr Nanostructured Media, Belfast BT7 1NN, Antrim, North Ireland
[2] Univ St Andrews, Sch Chem, St Andrews KY1 69ST, Fife, Scotland
[3] Univ Cambridge, Dept Earth Sci, Cambridge CB2 3EQ, England
基金
英国工程与自然科学研究理事会;
关键词
D O I
10.1063/1.2990760
中图分类号
O59 [应用物理学];
学科分类号
摘要
Thin lamellae were cut from bulk single crystal BaTiO3 using a focused ion beam microscope. They were then removed and transferred onto single crystal MgO substrates, so that their functional properties could be measured independent of the original host bulk ferroelectric. The temperature dependence of the capacitance of these isolated single crystal films was found to be strongly bulklike, demonstrating a sharp Curie anomaly, as well as Curie-Weiss behavior. In addition, the sudden change in the remanent polarization as a function of temperature at T-C was characteristic of a first order phase change. The work represents a dramatic improvement on that previously published by Saad et al. [J. Phys.: Condens. Matter 16, L451 (2004)], as critical shortcomings in the original specimen geometry, involving potential signal contributions from bulk BaTiO3, have now been obviated. That the functional properties of single crystal thin film lamellae are comparable to bulk, and not like those of conventionally deposited heterogeneous thin film systems, has therefore been confirmed. (C) 2008 American Institute of Physics.
引用
收藏
页数:3
相关论文
共 36 条
[1]   The dielectric response as a function of temperature and film thickness of fiber-textured (Ba,Sr)TiO3 thin films grown by chemical vapor deposition [J].
Basceri, C ;
Streiffer, SK ;
Kingon, AI ;
Waser, R .
JOURNAL OF APPLIED PHYSICS, 1997, 82 (05) :2497-2504
[2]   Electric-field penetration into metals: Consequences for high-dielectric-constant capacitors [J].
Black, CT ;
Welser, JJ .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1999, 46 (04) :776-780
[3]   Smearing of phase transition due to a surface effect or a bulk inhomogeneity in ferroelectric nanostructures [J].
Bratkovsky, AM ;
Levanyuk, AP .
PHYSICAL REVIEW LETTERS, 2005, 94 (10)
[4]   Strain gradients in epitaxial ferroelectrics [J].
Catalan, G ;
Noheda, B ;
McAneney, J ;
Sinnamon, LJ ;
Gregg, JM .
PHYSICAL REVIEW B, 2005, 72 (02)
[5]   The effect of flexoelectricity on the dielectric properties of inhomogeneously strained ferroelectric thin films [J].
Catalan, G ;
Sinnamon, LJ ;
Gregg, JM .
JOURNAL OF PHYSICS-CONDENSED MATTER, 2004, 16 (13) :2253-2264
[6]   Evaluation of tailored electrode (Ba,Sr)RuO3 for (Ba,Sr)TiO3 [J].
Choi, DK ;
Kim, BS ;
Son, SY ;
Oh, SH ;
Park, KW .
JOURNAL OF APPLIED PHYSICS, 1999, 86 (06) :3347-3351
[7]   Models of electrode-dielectric interfaces in ferroelectric thin-film devices [J].
Dawber, M ;
Scott, JF .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2002, 41 (11B) :6848-6851
[8]   Sharp ferroelectric phase transition in strained single-crystalline SrRuO3/Ba0.7Sr0.3TiO3/SrRuO3 capacitors [J].
Dittmann, R ;
Plonka, R ;
Vasco, E ;
Pertsev, NA ;
He, JQ ;
Jia, CL ;
Hoffmann-Eifert, S ;
Waser, R .
APPLIED PHYSICS LETTERS, 2003, 83 (24) :5011-5013
[9]   Stabilization of monodomain polarization in ultrathin PbTiO3 films [J].
Fong, DD ;
Kolpak, AM ;
Eastman, JA ;
Streiffer, SK ;
Fuoss, PH ;
Stephenson, GB ;
Thompson, C ;
Kim, DM ;
Choi, KJ ;
Eom, CB ;
Grinberg, I ;
Rappe, AM .
PHYSICAL REVIEW LETTERS, 2006, 96 (12)
[10]   Ferroelectricity in ultrathin perovskite films [J].
Fong, DD ;
Stephenson, GB ;
Streiffer, SK ;
Eastman, JA ;
Auciello, O ;
Fuoss, PH ;
Thompson, C .
SCIENCE, 2004, 304 (5677) :1650-1653