Further insights into the photodegradation of poly(3-hexylthiophene) by means of X-ray photoelectron spectroscopy

被引：92

作者：

Manceau, Matthieu ^{[1
,2
,3
]}

Gaume, Julien ^{[1
,2
]}

Rivaton, Agnes ^{[1
,2
]}

Gardette, Jean-Luc ^{[1
,2
]}

Monier, Guillaume ^{[4
,5
]}

Bideux, Luc ^{[4
,5
]}

机构：

[1] Univ Clermont Ferrand, Clermont Univ, LPMM, F-63000 Clermont Ferrand, France

[2] CNRS, UMR 6505, LPMM, F-63177 Aubiere, France

[3] CEA Grenoble DRT LITEN DTS LCS, INES RDI, Lab Composants Solaires, F-73377 Le Bourget Du Lac, France

[4] Univ Clermont Ferrand, Clermont Univ, LASMEA, F-63000 Clermont Ferrand, France

[5] CNRS, UMR 6602, LASMEA, F-63177 Aubiere, France

来源：

THIN SOLID FILMS | 2010年 / 518卷 / 23期

关键词：

Poly(3-hexylthiophene); Degradation; X-ray photoelectron spectroscopy; Organic photovoltaic; UV light irradiation; SOLID-STATE PHOTOCHEMISTRY; MECHANISMS; CHEMISTRY; OXYGEN;

D O I：

10.1016/j.tsf.2010.06.042

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

X-ray photoelectron spectroscopy (XPS) was used to monitor the chemical changes resulting from irradiation (>295 nm) in air of poly(3-hexylthiophene) (P3HT), polymer which is a good candidate for photovoltaic applications. The formation of carbonyl moieties and the stepwise oxidation of sulphur atoms were characterised. The oxidation and the cleavage of the hexyl side-chain was monitored. It is also shown that sulfur was first converted into sulfoxides, then into sulfones and finally into sulfinate esters. The formation of these ultimate degradation products provoked a disruption of pi-conjugation in P3HT, leading to diminished visible absorbance. Based on these results, a mechanism of P3HT photooxidation is proposed. Comparison of XPS data with previously reported infrared and UV-visible spectral analysis showed that the information provided by these techniques is completely consistent. (C) 2010 Elsevier B.V. All rights reserved.

引用

页码：7113 / 7118

页数：6

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