Quantitative measurement of tip-sample forces by dynamic force spectroscopy in ambient conditions

被引：20

作者：

Hölscher, H

Anczykowski, B

机构：

[1] CeNTech, D-48149 Munster, Germany

[2] Univ Munster, Inst Phys, D-48149 Munster, Germany

[3] Nanoanalyt GmbH, D-48149 Munster, Germany

来源：

SURFACE SCIENCE | 2005年 / 579卷 / 01期

关键词：

atomic force microscopy; adhesion;

D O I：

10.1016/j.susc.2005.01.026

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

We introduce a dynamic force spectroscopy technique enabling the quantitative measurement of conservative and dissipative tip-sample forces in ambient conditions. In difference to the commonly detected force-vs-distance curves dynamic force microscopy allows to measure the full range of tip-sample forces without hysteresis effects caused by a jump-to-contact. The approach is based on the specific behavior of a self-driven cantilever (frequency-modulation technique). Experimental applications on different samples (Fischer-sample, silicon wafer) are presented. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：21 / 26

页数：6

共 21 条

[1] FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].