PBII processing of dielectric layers: physical aspects limitations and experimental results

被引:30
作者
Lacoste, A
Le Coeur, F
Arnal, Y
Pelletier, J
Grattepain, C
机构
[1] LEMD, CNRS, F-38042 Grenoble, France
[2] Thomson CSF, LCR, F-91404 Orsay, France
关键词
plasma immersion; ion implantation; dielectric substrates; polymers; silicon on glass;
D O I
10.1016/S0257-8972(00)00993-2
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Processing of dielectric layers using a plasma-based ion implantation (PBII) technique has general implications in terms of plasma specifications and pulse characteristics. In particular, the different aspects of the processing of dielectric layers are discussed as functions of plasma density, pulse duration, and layer characteristics (thickness and permittivity). Clearly, severe limitations (true implantation energy, arcing) may appear for high-density plasmas as well as for long pulse durations when processing dielectric layers with thicknesses in the millimeter range. Typical examples of ion implantation in dielectric materials are presented, e.g. oxygen ion implantation in polymer sheets (for hydrophilic or adhesion treatments) and nitrogen implantation of polysilicon films on glass. The experimental results demonstrate the feasibility of processing dielectric layers with the PBII technique, but with severe limitations resulting from the process itself. (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:268 / 273
页数:6
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