Polycrystalline lead iodide films for digital X-ray sensors

被引:36
作者
Bennett, PR
Shah, KS
Dmitriev, Y
Klugerman, M
Gupta, T
Squillante, M
Street, R
Partain, L
Zentai, G
Pavyluchova, R
机构
[1] Radiat Monitoring Devices Inc, Watertown, MA 02472 USA
[2] Xerox PARC, Palo Alto, CA 94304 USA
[3] Varian Med Syst, Mountain View, CA 94043 USA
关键词
X-ray sensor; semiconductor; radiography;
D O I
10.1016/S0168-9002(03)01066-0
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
Polycrystalline lead iodide (PbI2) is one of only a few materials commonly mentioned as a potential direct converter for digital X-ray sensors. Previous evaluations have noted higher than desirable leakage currents and commented on imaging characteristics from sensors constructed with PbI2 films deposited onto amorphous Si thin film transistor arrays. Changes in film growth parameters show a significant reduction in leakage current, to 10's of pA/mm(2) (or less than 1 pA/pixel). Sensitivity remains good but is limited by incomplete X-ray absorption and lag. Image samples are derived from two different a-Si TFT designs, demonstrating high resolution and good contrast. (C) 2003 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:269 / 272
页数:4
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