Chemisorption of C60 on the Si(001)-2 x 1 surface at room temperature

被引:21
作者
Cheng, CP [1 ]
Pi, TW
Ouyang, CP
Wen, JF
机构
[1] Natl Chiayi Univ, Dept Appl Phys, Chiayi, Taiwan
[2] Natl Synchrotron Radiat Res Ctr, Hsinchu, Taiwan
[3] Natl Tsing Hua Univ, Dept Mat Sci & Engn, Hsinchu, Taiwan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2005年 / 23卷 / 03期
关键词
D O I
10.1116/1.1924608
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A synchrotron-radiation photoemission study Of C-60 deposited on a clean Si(001)-2 X 1 surface at room temperature is presented. It is found that the C-60 molecules are chemisorbed on the Si(001)2 X I surface with a characteristic of the covalent bond. A Si-C-60 hybridization causes charge transfer from the Si substrate to the C-60 molecules. Consequently, induced surface components appear in the Si 2p and C I s cores with opposite signs. To be specific for I monolayer coverage, two interface-induced Si 2p components are clearly resolved at the core-level shifts of +0.38 and +0.97 eV. For the C Is cores, in addition to a C-60-related peak at 284.50 eV, an induced peak shows up with a negative shift of -0.70 eV, suggesting that the carbon atoms hybridized with silicon surface atoms gain charge. (c) 2005 American Vacuum Society.
引用
收藏
页码:1018 / 1023
页数:6
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