Reduction of structural defects in II-VI blue green laser diodes

被引:42
作者
Chu, CC
Ng, TB
Han, J
Hua, GC
Gunshor, RL
Ho, E
Warlick, EL
Kolodziejski, LA
Nurmikko, AV
机构
[1] MIT,DEPT ELECT ENGN & COMP SCI,CAMBRIDGE,MA 02139
[2] BROWN UNIV,DIV ENGN,PROVIDENCE,RI 02912
关键词
D O I
10.1063/1.117920
中图分类号
O59 [应用物理学];
学科分类号
摘要
Early blue/green laser diodes based on ZnSe exhibited room temperature, continuous wave (cw) lifetimes of the order of a minute. Similar to the history of (Al,Ga)As lasers, the source of the degradation was the presence of extended crystalline defects. The dominant extended defects in the early room temperature cw lasers originated as stacking faults generated at the ZnSe/GaAs heterovalent nucleation event, and exhibited densities of the order of 10(6) cm(-2). In this letter, a procedure is described which will ensure a consistent run to run reduction of the density of such extended defects to the mid to low 10(3) cm(-2) over a 3 in. wafer. (C) 1996 American Institute of Physics.
引用
收藏
页码:602 / 604
页数:3
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