Temperature-induced morphological changes of ZnO grown by metalorganic chemical vapor deposition

被引:50
作者
Park, JY [1 ]
Lee, DJ [1 ]
Yun, YS [1 ]
Moon, JH [1 ]
Lee, BT [1 ]
Kim, SS [1 ]
机构
[1] Chonnam Natl Univ, Dept Mat Sci & Engn, Photon & Elect Thin Film Lab, Kwangju 500757, South Korea
关键词
crystal morphology; metalorganic chemical vapor deposition; inc oxide; semiconducting II-VI materials; light emitting diodes;
D O I
10.1016/j.jcrysgro.2004.11.326
中图分类号
O7 [晶体学];
学科分类号
0702 ; 070205 ; 0703 ; 080501 ;
摘要
Changes of morphology during the growth of ZnO on Al2O3 (0001) substrates by metalorganic chemical vapor deposition (MOCVD) were investigated as a function of growth temperature (T-g). The morphology of ZnO changes dramatically with T-g. At very low growth temperatures of T-g <= 200 degrees C, no meaningful ZnO forms. At 200 degrees C < T-g <= 260 degrees C, columnar grained, textured ZnO films having a large amount of crystalline defects grow. At higher growth temperatures of 260 degrees C < T-g <= 320 degrees C. arrays of vertically well-aligned ZnO nanorods grow. The nanorods are aligned epitaxially with a 30 degrees rotation of ZnO basal planes with respect to Al2O3 basal planes. At further higher growth temperatures of 320 degrees C < T-g <= 380 degrees C, ZnO of nanoneedle type grows. However, at T-g > 380 degrees C, ZnO nanowires start to grow on top of a continuous ZnO layer. Both the nanoneedles and the nanowires are not only well aligned both in the out-of- and in the in-plane direction, but also show a very low density of crystalline defects. Our results suggest that T-g is one of the key processing parameters and need to be optimized in a narrow regime in order to grow a desired type of ZnO in MOCVD process. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:158 / 164
页数:7
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