The potential of functional scaling

被引：13

作者：

Chin, A ^{[1
]}

McAlister, SP

机构：

[1] Natl Chiao Tung Univ, Nano Sci Technol Ctr, Hsinchu, Taiwan

[2] Natl Res Council Canada, Inst Microstruct Sci, Ottawa, ON, Canada

来源：

IEEE CIRCUITS & DEVICES | 2005年 / 21卷 / 01期

关键词：

D O I：

10.1109/MCD.2005.1388766

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

引用

页码：27 / 35

页数：9

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