Correlation between Er3+ emission and Si clusters in Erbium-doped a-SiOx:H films

被引:2
作者
Chen, CY
Chen, WD
Song, SF
Xu, ZJ
Liao, XB
Li, GH
Bian, LF
Ding, K
机构
[1] Chinese Acad Sci, Inst Semicond, Beijing 100083, Peoples R China
[2] Chinese Acad Sci, Natl Lab Superlattices & Microstruct, Beijing 100083, Peoples R China
基金
中国国家自然科学基金;
关键词
Si clusters; erbium; emission;
D O I
10.1016/j.physe.2004.09.004
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Erbium-doped hydrogenated amorphous silicon suboxide films containing silicon clusters (a-SiOx:H) were prepared. The samples exhibited photoluminescence (PL) peaks at around 750nm and 1.54 mu m, which could be assigned to the electron-hole recombination in silicon clusters and the intra-4f transition in Er3+, respectively. We compared annealing behaviors of Si clusters and Er3+ emission and found that Si clusters emission depends strongly upon crystallinity of Si clusters, whereas Er3+ emission is not sensitive to whether it is Si nanocrystals (nc-Si) or amorphous Si (a-Si) clusters. The erbium-doped a-SiOx:H films containing either a-Si clusters or nc-Si have the same kind of Er3+ -emitting centers. Based on these results, it is concluded that a-Si clusters can play the same role on Er3+ excitation as nc-Si. (c) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码:21 / 25
页数:5
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