Nearly lattice-matched n, i, and p layers for InGaN p-i-n photodiodes in the 365-500 nm spectral range

被引:21
作者
Berkman, E. A. [1 ]
El-Masry, N. A. [1 ]
Emara, A. [2 ]
Bedair, S. M. [2 ]
机构
[1] N Carolina State Univ, Dept Mat Sci & Engn, Raleigh, NC 27695 USA
[2] N Carolina State Univ, Dept Elect & Comp Engn, Raleigh, NC 27695 USA
关键词
D O I
10.1063/1.2896648
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report on nearly lattice-matched grown InGaN based p-i-n photodiodes detecting in the 365-500 nm range with tunable peak responsivity tailored by the i-layer properties. The growth of lattice matched i- and n-InGaN layer leads to improvement in the device performance. This approach produced photodiodes with zero-bias responsivities up to 0.037 A/W at 426 nm, corresponding to 15.5% internal quantum efficiency. The peak responsivity wavelength ranged between 416 and 466 nm, the longest reported for III-N photodiodes. The effects of InN content and i-layer thickness on photodiode properties and performance are discussed. (C) 2008 American Institute of Physics.
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页数:3
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