Controlled modifications of electron injection on Au/Si and Au/SiO2/Si contacts using ballistic electron emission microscopy

被引：3

作者：

Chahboun, A

Coratger, R

Pascale, A

Baules, P

Ajustron, F

Zorkani, I

Beauvillain, J

机构：

[1] CNRS, CEMES, F-31055 Toulouse, France

[2] Dhar Mehraz Sci Fac, Dept Phys, Fes, Morocco

来源：

JOURNAL OF APPLIED PHYSICS | 2001年 / 89卷 / 11期

关键词：

D O I：

10.1063/1.1365432

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

In this article, ballistic electron emission microscopy (BEEM) induced modifications on Au/Si and Au/SiO2/Si contacts are presented. BEEM current can be locally enhanced or reduced in a controlled manner. These observations are attributed to tip induced modifications on the gold surface. According to Au thickness, x-ray reflectivity experiments show different surface evolutions correlated to the size variations of the modifications introduced as a function of time. (C) 2001 American Institute of Physics.

引用

页码：6302 / 6307

页数：6

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