Amorphous-silicon thin-film transistors fabricated at 300 °C on a free-standing foil substrate of clear plastic

被引:52
作者
Cherenack, Kunigunde H. [1 ]
Kattamis, Alex Z.
Hekmatshoar, Bahman
Sturm, James C.
Wagner, Sigurd
机构
[1] Princeton Univ, Dept Elect Engn, Princeton, NJ 08544 USA
[2] Princeton Univ, Princeton Inst Sci & Technol Mat, Princeton, NJ 08544 USA
关键词
amorphous silicon (a-Si); gate-bias stress; mechanical stress; plastic substrate; stability; thin-film transistor (TFT);
D O I
10.1109/LED.2007.907411
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have made hydrogenated amorphous-silicon thin-film transistors (TFTs) at a process temperature of 300 degrees C on free-standing clear-plastic foil substrates. The key to the achievement of flat and smooth samples was to design the mechanical stresses in the substrate passivation and transistor layers, allowing us to obtain functional transistors over the entire active surface. Back-channel-passivated TFTs made at 300 degrees C on glass substrates and plastic substrates have identical electrical characteristics and gate-bias-stress stability. These results suggest that free-standing clear-plastic foil can replace display glass as a substrate from the points of process temperature, substrate and device integrity, and TFT performance and stability.
引用
收藏
页码:1004 / 1006
页数:3
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