Fabrication of sawtooth diffraction gratings using nanoimprint lithography

被引:39
作者
Chang, CH
Heilmann, RK
Fleming, RC
Carter, J
Murphy, E
Bailey, TC
Ekerdt, JG
Frankel, RD
Voisin, R
机构
[1] MIT, Cambridge, MA 02139 USA
[2] Univ Texas, Texas Mat Inst, Austin, TX 78759 USA
[3] Chromaplex Inc, W Henrietta, NY 14586 USA
[4] Mol Imprints Inc, Austin, TX 78758 USA
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B | 2003年 / 21卷 / 06期
关键词
D O I
10.1116/1.1627814
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We report a process which integrates interference lithography, nanoimprint lithography, and anisotropic etching to fabricate replicated diffraction gratings with sawtooth profiles. This new process greatly reduces grating fabrication time and cost, while preserving the groove shape and smoothness. Relief gratings with 400 nm period inverted triangular profiles and 200 nm period gratings with 7degrees blaze angle were replicated from silicon masters with surface roughness of less than 1 nm. This process was developed for fabricating the off-plane blazed diffraction gratings for the NASA Constellation-X x-ray telescope. (C) 2003 American Vacuum Society.
引用
收藏
页码:2755 / 2759
页数:5
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