Crystal structure analysis under uniaxial strain at low temperature using a unique design of four-axis x-ray diffractometer with a fixed sample

被引:78
作者
Kondo, R [1 ]
Kagoshima, S
Harada, J
机构
[1] Univ Tokyo, Dept Art & Sci, Tokyo 1538902, Japan
[2] Rigaku Corp, Xray Res Lab, Tokyo 1968666, Japan
关键词
D O I
10.1063/1.2001607
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
For the purpose of crystal structure analysis under uniaxial strain at low temperatures, we developed a pressure cell for uniaxial compression and a unique design of an x-ray diffractometer wherein both the x-ray source and the detector are capable of two-axial rotation with a fixed sample. This arrangement is advantageous to crystal structure analyses under extreme conditions that require a large and heavy apparatus. Using the present diffractometer, we performed the crystal structure analyses of the organic conductor, alpha-(BEDT-TTF)(2)I-3 (BEDT-TTF denotes bis(ethylene)dithio-tetrathiafulvalene), under uniaxial strain and ambient pressure, and at room and low temperatures, and obtained results that were qualitatively consistent with those of resistivity measurements. (c) 2005 American Institute of Physics.
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页数:7
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