Laser-induced selective area band-gap tuning in Si/Si1-xGex microstructures

被引:11
作者
Dubowski, JJ [1 ]
Rowell, N
Aers, GC
Lafontaine, H
Houghton, DC
机构
[1] Natl Res Council Canada, Ottawa, ON K1A 0R6, Canada
[2] SiGe Microsyst Technol Inc, Ottawa, ON K1A 0R6, Canada
关键词
D O I
10.1063/1.123737
中图分类号
O59 [应用物理学];
学科分类号
摘要
A one-step process is reported for selective area band-gap tuning of as-grown quantum well (QW) material consisting of Si/Si1-xGex microstructures. The process takes advantage of the ability of increasing the local temperature of the wafer, in excess of 900 degrees C, by applying the beam of a high-power cw Nd:YAG laser, which leads to controlled intermixing between the quantum well and barrier material. A microstructure with the band-gap blueshifted by 142 meV has been fabricated from as-grown 980 meV band-gap material. The results indicate that this approach has the potential for "writing'' of Si/Si1-xGex QW microstructures with the selectively tuned band gap required in the fabrication of optoelectronic integrated circuits. (C) 1999 American Institute of Physics. [S0003-6951(99)04314-4].
引用
收藏
页码:1948 / 1950
页数:3
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