Density-functional-theory calculations for silicon vacancy migration

被引:5
作者
Wright, A. F. [1 ]
Wixom, R. R. [1 ]
机构
[1] Sandia Natl Labs, Albuquerque, NM 87185 USA
关键词
D O I
10.1063/1.2906342
中图分类号
O59 [应用物理学];
学科分类号
摘要
The saddle-point configurations and associated formation energies of a migrating silicon vacancy in the +2, +1, 0, -1, and -2 charge states were computed using density-functional theory with a plane wave basis set, norm-conserving pseudopotentials, and the generalized-gradient approximation for exchange and correlation. Spurious electrostatic and strain contributions arising from use of periodic boundary conditions were removed by performing maximum likelihood fits on results from 215-, 511-, and 999-atom supercells, and thereby obtaining formation energies corresponding to isolated vacancies. Migration enthalpies were computed by subtracting similarly obtained formation energies for vacancies in local-energy minimum configurations. The results (0.27 eV in the +2 charge state, 0.19 eV in the +1 charge state, 0.36 eV in the 0 charge state, 0.04 eV in the -1 charge state, and 0.15 eV in the -2 charge state) are in good overall agreement with experimental results obtained at low temperatures. (c) 2008 American Institute of Physics.
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页数:5
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共 42 条
[1]  
[Anonymous], 1986, DEEP CTR SEMICONDUCT
[2]   ELECTRONIC-STRUCTURE AND TOTAL-ENERGY MIGRATION BARRIERS OF SILICON SELF-INTERSTITIALS [J].
BARYAM, Y ;
JOANNOPOULOS, JD .
PHYSICAL REVIEW B, 1984, 30 (04) :1844-1852
[3]   THE LATTICE-PARAMETER OF HIGHLY PURE SILICON SINGLE-CRYSTALS [J].
BECKER, P ;
SEYFRIED, P ;
SIEGERT, H .
ZEITSCHRIFT FUR PHYSIK B-CONDENSED MATTER, 1982, 48 (01) :17-21
[4]   RAPID ANNEALING IN SILICON TRANSISTORS [J].
BINDER, D ;
BUTCHER, DT ;
CREPPS, JR ;
HAMMER, EL .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1968, NS15 (06) :84-+
[5]  
CAR R, 1992, MATER SCI FORUM, V83, P433, DOI 10.4028/www.scientific.net/MSF.83-87.433
[6]   Managing the supercell approximation for charged defects in semiconductors:: Finite-size scaling, charge correction factors, the band-gap problem, and the ab initio dielectric constant -: art. no. 035215 [J].
Castleton, CWM ;
Höglund, A ;
Mirbt, S .
PHYSICAL REVIEW B, 2006, 73 (03)
[7]  
Ershov S. N., 1977, Soviet Physics - Solid State, V19
[8]   Ab initio pseudopotentials for electronic structure calculations of poly-atomic systems using density-functional theory [J].
Fuchs, M ;
Scheffler, M .
COMPUTER PHYSICS COMMUNICATIONS, 1999, 119 (01) :67-98
[9]   COMPENSATION OF P-TYPE DOPING IN ZNSE - THE ROLE OF IMPURITY-NATIVE DEFECT COMPLEXES [J].
GARCIA, A ;
NORTHRUP, JE .
PHYSICAL REVIEW LETTERS, 1995, 74 (07) :1131-1134
[10]   INJECTION DEPENDENCE OF TRANSIENT ANNEALING IN NEUTRON-IRRADIATED SILICON DEVICES [J].
GREGORY, BL ;
SANDER, HH .
IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1967, NS14 (06) :116-+