Little influence of kinks on the formation of c(4X2) domains in a Si(001) surface at low temperature

被引:8
作者
Tochihara, H
Nakamura, Y
Kawai, H
Nakayama, M
Sato, T
Sueyoshi, T
Amakusa, T
Iwatsuki, M
机构
[1] Kyushu Univ, Dept Appl Phys, Fukuoka 8108560, Japan
[2] Kyushu Univ, Venture Business Lab, Fukuoka 8128581, Japan
[3] Kyushu Univ, Fac Sci, Dept Phys, Fukuoka 8108560, Japan
[4] Jeol Ltd, Tokyo 1968558, Japan
关键词
Si(001) surface; scanning tunneling microscopy; Monte Carlo simulation; kink; phase transition;
D O I
10.1143/JPSJ.67.2330
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
The structure of a Si(001) surface with monatomic steps is investigated by means of scanning tunneling microscopy at 95K and Monte Carlo simulations (MCS) at various temperatures. In particular, we pay attention to the effect of kinks at the step edge on the formation of c(4 x 3) domains, and both studies reveal that the kinks do not govern che growth of the domains. MCS demonstrates that the nucleation of c(4 x 2) domains takes place at central regions of the terrace as a result of thermal fluctuation, and that the domains propagate to the step edge with decreasing temperature.
引用
收藏
页码:2330 / 2334
页数:5
相关论文
共 27 条
[1]   SCANNING-TUNNELING-MICROSCOPY AT LOW-TEMPERATURES ON THE C(4X2)/(2X1) PHASE-TRANSITION OF SI(100) [J].
BADT, D ;
WENGELNIK, H ;
NEDDERMEYER, H .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :2015-2017
[2]   TUNNELING IMAGES OF ATOMIC STEPS ON THE SI(111)7X7 SURFACE [J].
BECKER, RS ;
GOLOVCHENKO, JA ;
MCRAE, EG ;
SWARTZENTRUBER, BS .
PHYSICAL REVIEW LETTERS, 1985, 55 (19) :2028-2031
[3]   7X7 RECONSTRUCTION ON SI(111) RESOLVED IN REAL SPACE [J].
BINNIG, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1983, 50 (02) :120-123
[4]   STABILITIES OF SINGLE-LAYER AND BILAYER STEPS ON SI(001) SURFACES [J].
CHADI, DJ .
PHYSICAL REVIEW LETTERS, 1987, 59 (15) :1691-1694
[5]   FORMATION OF THE 5X5 RECONSTRUCTION ON CLEAVED SI(111) SURFACES STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
FEENSTRA, RM ;
LUTZ, MA .
PHYSICAL REVIEW B, 1990, 42 (08) :5391-5394
[6]   DETERMINATION OF THE LOCAL ELECTRONIC-STRUCTURE OF ATOMIC-SIZED DEFECTS ON SI(001) BY TUNNELING SPECTROSCOPY [J].
HAMERS, RJ ;
KOHLER, UK .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04) :2854-2859
[7]   SCANNING TUNNELING MICROSCOPY OF SI(001) [J].
HAMERS, RJ ;
TROMP, RM ;
DEMUTH, JE .
PHYSICAL REVIEW B, 1986, 34 (08) :5343-5357
[8]   ORDER-DISORDER PHASE-TRANSITION ON THE SI(001) SURFACE - CRITICAL ROLE OF DIMER DEFECTS [J].
INOUE, K ;
MORIKAWA, Y ;
TERAKURA, K ;
NAKAYAMA, M .
PHYSICAL REVIEW B, 1994, 49 (20) :14774-14777
[9]   CLASSIFICATION AND STRUCTURE ANALYSES OF DOMAIN BOUNDARIES ON SI(111) [J].
ITOH, M ;
TANAKA, H ;
WATANABE, Y ;
UDAGAWA, M ;
SUMITA, I .
PHYSICAL REVIEW B, 1993, 47 (04) :2216-2227
[10]   OBSERVATION OF SURFACE RECONSTRUCTION ON SILICON ABOVE 800-DEGREES-C USING THE STM [J].
KITAMURA, S ;
SATO, T ;
IWATSUKI, M .
NATURE, 1991, 351 (6323) :215-217