CLASSIFICATION AND STRUCTURE ANALYSES OF DOMAIN BOUNDARIES ON SI(111)

被引:26
作者
ITOH, M
TANAKA, H
WATANABE, Y
UDAGAWA, M
SUMITA, I
机构
[1] Matsushita Research Institute Tokyo, Inc., Higashimita, Tama-ku
来源
PHYSICAL REVIEW B | 1993年 / 47卷 / 04期
关键词
D O I
10.1103/PhysRevB.47.2216
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A general scheme is proposed for the classification of 7 X 7-domain boundaries on Si(111). By applying this scheme to the data obtained by scanning tunneling microscopy, general proper-ties of atomic structures on Si(111) are derived. In particular, the possibility of the dimer-row-driven reconstruction mechanisms is ruled out, and hence another possibility is discussed.
引用
收藏
页码:2216 / 2227
页数:12
相关论文
共 46 条
[1]  
[Anonymous], 1986, THEORY ELASTICITY, DOI [DOI 10.1016/C2009-0-25521-8, 10.1016/C2009-0-25521-8]
[2]   LOW-ENERGY ELECTRON-MICROSCOPY OF SEMICONDUCTOR SURFACES [J].
BAUER, E ;
MUNDSCHAU, M ;
SWIECH, W ;
TELIEPS, W .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1991, 9 (03) :1007-1013
[3]   DIMER-ADATOM-STACKING-FAULT (DAS) AND NON-DAS (111) SEMICONDUCTOR SURFACES - A COMPARISON OF GE(111)-C (2X8) TO SI(111)-(2X2), SI(111)-(5X5), SI(111)-(7X7), AND SI(111)-(9X9) WITH SCANNING TUNNELING MICROSCOPY [J].
BECKER, RS ;
SWARTZENTRUBER, BS ;
VICKERS, JS ;
KLITSNER, T .
PHYSICAL REVIEW B, 1989, 39 (03) :1633-1647
[4]   NEW RECONSTRUCTIONS ON SILICON (111) SURFACES [J].
BECKER, RS ;
GOLOVCHENKO, JA ;
HIGASHI, GS ;
SWARTZENTRUBER, BS .
PHYSICAL REVIEW LETTERS, 1986, 57 (08) :1020-1023
[5]   TUNNELING IMAGES OF GERMANIUM SURFACE RECONSTRUCTIONS AND PHASE BOUNDARIES [J].
BECKER, RS ;
GOLOVCHENKO, JA ;
SWARTZENTRUBER, BS .
PHYSICAL REVIEW LETTERS, 1985, 54 (25) :2678-2680
[6]   SURFACE STUDIES BY SCANNING TUNNELING MICROSCOPY [J].
BINNING, G ;
ROHRER, H ;
GERBER, C ;
WEIBEL, E .
PHYSICAL REVIEW LETTERS, 1982, 49 (01) :57-61
[7]  
BURGHAUS T, 1988, SURF SCI, V193, P235
[8]   A SCANNING TUNNELING MICROSCOPE FOR SURFACE SCIENCE STUDIES [J].
DEMUTH, JE ;
HAMERS, RJ ;
TROMP, RM ;
WELLAND, ME .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 1986, 30 (04) :396-402
[9]   KINETICS OF THE SI(111)2 X 1-]5 X 5 AND 7 X 7 TRANSFORMATION STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
FEENSTRA, RM ;
LUTZ, MA .
SURFACE SCIENCE, 1991, 243 (1-3) :151-165
[10]   SURFACE-DIFFUSION AND PHASE-TRANSITION ON THE GE(111) SURFACE STUDIED BY SCANNING TUNNELING MICROSCOPY [J].
FEENSTRA, RM ;
SLAVIN, AJ ;
HELD, GA ;
LUTZ, MA .
PHYSICAL REVIEW LETTERS, 1991, 66 (25) :3257-3260