Electron-stimulated modification of Si surfaces

被引:51
作者
Nakayama, K [1 ]
Weaver, JH [1 ]
机构
[1] Univ Minnesota, Dept Mat Sci & Chem Engn, Minneapolis, MN 55455 USA
关键词
D O I
10.1103/PhysRevLett.82.980
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Scanning tunneling microscopy studies show significant structural modifications that involved atom desorption and displacement following mild irradiation by electrons of 90-2000 eV. For Si(111) (7 X 7), adatom layer vacancies increased monotonically with incident energy. For Si(100)-(2 x 1), irradiation produced dimer vacancies, and ad-dimers as Si atoms transferred to the terrace. The modification processes are tied to the energy distribution of electron-hole and electron attachment states achieved by inelastic cascade scattering. Hence, beams previously believed to be benign induce surface structural modifications. [S0031-9007(99)08389-1].
引用
收藏
页码:980 / 983
页数:4
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