Subangstrom resolution by underfocused incoherent transmission electron microscopy

被引：135

作者：

Nellist, PD

Pennycook, SJ

机构：

[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England

[2] Oak Ridge Natl Lab, Div Solid State, Oak Ridge, TN 37831 USA

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 81卷 / 19期

关键词：

D O I：

10.1103/PhysRevLett.81.4156

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

It is quantitatively explained why incoherent transmission electron microscope imaging is extremely robust to the effects of chromatic aberration, which usually limits the resolution in the conventional coherent mode of imaging. Combining this robustness with using underfocus to counter the effects of spherical aberration, we demonstrate subangstrom lattice resolution and information transfer to 0.078 nm.

引用

页码：4156 / 4159

页数：4

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