Evolution of the GaAs(001) surface structure during the transition from the As-rich (2x4) to the Ga-rich (4x2) reconstruction

被引:26
作者
Chizhov, I
Lee, G
Willis, RF
Lubyshev, D
Miller, DL
机构
[1] Penn State Univ, Dept Phys, University Pk, PA 16802 USA
[2] Penn State Univ, Dept Elect Engn, University Pk, PA 16802 USA
关键词
gallium arsenide; low-energy electron diffraction; scanning tunneling microscopy; surface phase transitions; III-V semiconductors;
D O I
10.1016/S0039-6028(98)00634-7
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
Evolution of the GaAs(001) surface during the transition from the As-rich (2 x 4) to the Ga-rich (4 x 2) reconstruction has been studied by scanning tunneling microscopy (STM) and low-energy electron diffraction (LEED). It has been found that the (2 x 4)-(4 x 2) transition proceeds via the formation of intermediate phases exhibiting (3 x 6) and (4 x 6) LEED patterns. STM images indicate that these phases are multi-domain. In particular, the (3 x 6) phase is locally composed of domains of the "(2 x 6)" and disordered phases, while the (4 x 6) phase in addition contains (4 x 2) domains. To explain STM images taken in a dual polarity bias mode, structural models for the "(2 x 6)" and disordered phases are proposed. These structures are electrostatically compensated via disorder of As ("2 x 6" phase) and Ga (disordered phase) dimers. A comprehensive picture of the (2 x 4)-(4 x 2) phase transition based on the analysis of the STM data is presented. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
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页码:1 / 11
页数:11
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