Surface charge density and evolution of domain structure in triglycine sulfate determined by electrostatic-force microscopy

被引:124
作者
Hong, JW [1 ]
Noh, KH
Park, S
Kwun, SI
Khim, ZG
机构
[1] Seoul Natl Univ, Dept Phys, Seoul 151742, South Korea
[2] Seoul Natl Univ, Condensed Matter Res Inst, Seoul 151742, South Korea
[3] PSIA Corp, Seoul 137070, South Korea
来源
PHYSICAL REVIEW B | 1998年 / 58卷 / 08期
关键词
D O I
10.1103/PhysRevB.58.5078
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
A dynamic contact mode operation of electrostatic-force microscopy (EFM) with an ac modulation has been developed and used to investigate the domain structure and dynamics of a triglycine sulfate single crystal. Well-separated topographic and domain contrast images have been obtained by detecting the force instead of the force gradient in the dynamic contact mode operation of EFM. Surface charge density and the anisotropic domain wall thickness have been measured. The evolution of domains embedded in an oppositely polarized larger domain indicates the existence of a significant interaction between domains of the same polarity.
引用
收藏
页码:5078 / 5084
页数:7
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