Electrical properties of two-dimensional electron gases grown on cleaned SiGe virtual substrates

被引:27
作者
Paul, DJ
Ahmed, A
Griffin, N
Pepper, M
Churchill, AC
Robbins, DJ
Wallis, DJ
机构
[1] Univ Cambridge, Cavendish Lab, Cambridge CB3 0HE, England
[2] Def Evaluat & Res Agcy, Elect Sector, Malvern WR14 3PS, Worcs, England
基金
英国工程与自然科学研究理事会;
关键词
electrical properties; two-dimensional electron gases; SiGe substrates;
D O I
10.1016/S0040-6090(98)00470-2
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The low temperature electrical properties of modulation-doped two-dimensional electron gases (2DEG) in the SiGe system were studied. The effect on the electrical properties of removing the substrate from the growth chamber after the growth of the virtual substrate, chemically cleaning the virtual substrate and then growing the 2DEG on a thin SiGe buffer were investigated. The results demonstrate that the carrier density and mobility decrease as the regrowth interface is moved closer to the 2DEG. Lower temperature desorption of the passivating chemical oxide improves the mobility and carrier density when a regrowth interface is close to the quantum well. The mismatch of Ge content in the virtual substrate and the heterolayers was also shown to produce a reduction in the carrier density and mobility. Crown Copyright (C) 1998 Published by Elsevier Science S.A. All rights reserved.
引用
收藏
页码:181 / 185
页数:5
相关论文
共 23 条
[1]   High speed P-type SiGe modulation-doped field-effect transistors [J].
Arafa, M ;
Fay, P ;
Ismail, K ;
Chu, JO ;
Meyerson, BS ;
Adesida, I .
IEEE ELECTRON DEVICE LETTERS, 1996, 17 (03) :124-126
[2]   ELECTRONIC-PROPERTIES OF A ONE-DIMENSIONAL CHANNEL FIELD-EFFECT TRANSISTOR FORMED BY MOLECULAR-BEAM EPITAXIAL REGROWTH ON PATTERNED GAAS [J].
BURROUGHES, JH ;
LEADBEATER, ML ;
GRIMSHAW, MP ;
EVANS, RJ ;
RITCHIE, DA ;
JONES, GAC ;
PEPPER, M .
APPLIED PHYSICS LETTERS, 1993, 63 (16) :2219-2221
[3]   High-mobility two-dimensional electron gases in Si/SiGe heterostructures on relaxed SiGe layers grown at high temperature [J].
Churchill, AC ;
Robbins, DJ ;
Wallis, DJ ;
Griffin, N ;
Paul, DJ ;
Pidduck, AJ .
SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 1997, 12 (08) :943-946
[4]   ELECTRONIC TRANSPORT-PROPERTIES OF A TWO-DIMENSIONAL ELECTRON-GAS IN A SILICON QUANTUM-WELL STRUCTURE AT LOW-TEMPERATURE [J].
GOLD, A .
PHYSICAL REVIEW B, 1987, 35 (02) :723-733
[5]   CONDUCTIVITY, PLASMON, AND CYCLOTRON-RESONANCE ANOMALIES IN SI(100) METAL-OXIDE-SEMICONDUCTOR SYSTEMS [J].
GOLD, A .
PHYSICAL REVIEW B, 1985, 32 (06) :4014-4027
[6]   EFFECT OF THE PROXIMITY OF AN EX-SITU PATTERNED INTERFACE ON THE QUALITY OF 2-DIMENSIONAL ELECTRON GASES AT GAAS/ALGAAS HETEROJUNCTIONS [J].
GRIMSHAW, MP ;
RITCHIE, DA ;
BURROUGHS, JH ;
JONES, GAC .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (02) :1290-1292
[7]   SI/SIGE EPITAXIAL-BASE TRANSISTORS .2. PROCESS INTEGRATION AND ANALOG APPLICATIONS [J].
HARAME, DL ;
COMFORT, JH ;
CRESSLER, JD ;
CRABBE, EF ;
SUN, JYC ;
MEYERSON, BS ;
TICE, T .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 1995, 42 (03) :469-482
[8]  
Ismail K, 1995, INTERNATIONAL ELECTRON DEVICES MEETING, 1995 - IEDM TECHNICAL DIGEST, P509, DOI 10.1109/IEDM.1995.499249
[9]   GATED HALL-EFFECT MEASUREMENTS IN HIGH-MOBILITY N-TYPE SI/SIGE MODULATION-DOPED HETEROSTRUCTURES [J].
ISMAIL, K ;
ARAFA, M ;
STERN, F ;
CHU, JO ;
MEYERSON, BS .
APPLIED PHYSICS LETTERS, 1995, 66 (07) :842-844
[10]   ELECTRON-TRANSPORT PROPERTIES OF SI/SIGE HETEROSTRUCTURES - MEASUREMENTS AND DEVICE IMPLICATIONS [J].
ISMAIL, K ;
NELSON, SF ;
CHU, JO ;
MEYERSON, BS .
APPLIED PHYSICS LETTERS, 1993, 63 (05) :660-662