Spectroscopic THz near-field microscope

被引：127

作者：

von Ribbeck, H. -G. ^{[1
,2
]}

Brehm, M. ^{[1
,2
]}

van der Weide, D. W. ^{[3
]}

Winnerl, S. ^{[4
]}

Drachenko, O. ^{[4
]}

Helm, M. ^{[4
]}

Keilmann, F. ^{[1
,2
]}

机构：

[1] Max Planck Inst Biochem, D-82152 Martinsried, Germany

[2] Ctr Nanosci, D-82152 Martinsried, Germany

[3] Univ Wisconsin, Dept Elect & Comp Engn, Madison, WI 53706 USA

[4] Forschungzentrum Dresden Rossendorf, D-01314 Dresden, Germany

来源：

OPTICS EXPRESS | 2008年 / 16卷 / 05期

关键词：

D O I：

10.1364/OE.16.003430

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We demonstrate a scattering-type scanning near-field optical microscope (s-SNOM) with broadband THz illumination. A cantilevered W tip is used in tapping AFM mode. The direct scattering spectrum is obtained and optimized by asynchronous optical sampling (ASOPS), while near-field scattering is observed by using a space-domain delay stage and harmonic demodulation of the detector signal. True near-field interaction is determined from the approach behavior of the tip to Au samples. Scattering spectra of differently doped Si are presented. (C) 2008 Optical Society of America.

引用

页码：3430 / 3438

页数：9

共 45 条

[1]

Anlage SM, 2001, NATO ADV SCI I E-APP, V375, P239

[2] Ultrafast time-domain spectroscopy based on high-speed asynchronous optical sampling [J].

Bartels, A. ;

Cerna, R. ;

Kistner, C. ;

Thoma, A. ;

Hudert, F. ;

Janke, C. ;

Dekorsy, T. .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2007, 78 (03)

[3] High-resolution THz spectrometer with kHz scan rates [J].

Bartels, A ;

Thoma, A ;

Janke, C ;

Dekorsy, T ;

Dreyhaupt, A ;

Winnerl, S ;

Helm, M .

OPTICS EXPRESS, 2006, 14 (01) :430-437

[4]

BREHM M, 2006, THESIS TU MUNCHEN, P128

[5] Spectroscopic near-field microscopy using frequency combs in the mid-infrared [J].

Brehm, Markus ;

Schliesser, Albert ;

Keilmann, Fritz .

OPTICS EXPRESS, 2006, 14 (23) :11222-11233

[6] Infrared spectroscopic mapping of single nanoparticles and viruses at nanoscale resolution [J].

Brehm, Markus ;

Taubner, Thomas ;

Hillenbrand, Rainer ;

Keilmann, Fritz .

NANO LETTERS, 2006, 6 (07) :1307-1310

[7] Terahertz microscopy of charge carriers in semiconductors [J].

Buersgens, F ;

Kersting, R ;

Chen, HT .

APPLIED PHYSICS LETTERS, 2006, 88 (11)

[8] Imaging with terahertz radiation [J].

Chan, Wai Lam ;

Deibel, Jason ;

Mittleman, Daniel M. .

REPORTS ON PROGRESS IN PHYSICS, 2007, 70 (08) :1325-1379

[9] Terahertz imaging with nanometer resolution [J].

Chen, HT ;

Kersting, R ;

Cho, GC .

APPLIED PHYSICS LETTERS, 2003, 83 (15) :3009-3011

[10] Analytical model for quantitative prediction of material contrasts in scattering-type near-field optical microscopy [J].

Cvitkovic, A. ;

Ocelic, N. ;

Hillenbrand, R. .

OPTICS EXPRESS, 2007, 15 (14) :8550-8565

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