Density multiplication and improved lithography by directed block copolymer assembly

被引:1099
作者
Ruiz, Ricardo [1 ]
Kang, Huiman [2 ]
Detcheverry, Francois A. [2 ]
Dobisz, Elizabeth [1 ]
Kercher, Dan S. [1 ]
Albrecht, Thomas R. [1 ]
de Pablo, Juan J. [2 ]
Nealey, Paul F. [2 ]
机构
[1] Hitachi Global Storage Technol, San Jose Res Ctr, San Jose, CA 95135 USA
[2] Univ Wisconsin, Dept Biol & Chem Engn, Madison, WI 53706 USA
关键词
D O I
10.1126/science.1157626
中图分类号
O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];
学科分类号
07 ; 0710 ; 09 ;
摘要
Self-assembling materials spontaneously form structures at length scales of interest in nanotechnology. In the particular case of block copolymers, the thermodynamic driving forces for self- assembly are small, and low- energy defects can get easily trapped. We directed the assembly of defect- free arrays of isolated block copolymer domains at densities up to 1 terabit per square inch on chemically patterned surfaces. In comparing the assembled structures to the chemical pattern, the density is increased by a factor of four, the size is reduced by a factor of two, and the dimensional uniformity is vastly improved.
引用
收藏
页码:936 / 939
页数:4
相关论文
共 31 条
[1]  
[Anonymous], 2005, INT TECHN ROADM SEM
[2]   BLOCK COPOLYMER THERMODYNAMICS - THEORY AND EXPERIMENT [J].
BATES, FS ;
FREDRICKSON, GH .
ANNUAL REVIEW OF PHYSICAL CHEMISTRY, 1990, 41 (01) :525-557
[3]   Orientational order in block copolymer films zone annealed below the order-disorder transition temperature [J].
Berry, Brian C. ;
Bosse, August W. ;
Douglas, Jack F. ;
Jones, Ronald L. ;
Karim, Alamgir .
NANO LETTERS, 2007, 7 (09) :2789-2794
[4]   Polymer self assembly in semiconductor microelectronics [J].
Black, C. T. ;
Ruiz, R. ;
Breyta, G. ;
Cheng, J. Y. ;
Colburn, M. E. ;
Guarini, K. W. ;
Kim, H.-C. ;
Zhang, Y. .
IBM JOURNAL OF RESEARCH AND DEVELOPMENT, 2007, 51 (05) :605-633
[5]   Polymer self-assembly as a novel extension to optical lithography [J].
Black, Charles T. .
ACS NANO, 2007, 1 (03) :147-150
[6]   Fabrication of complex three-dimensional nanostructures from self-assembling block copolymer materials on two-dimensional chemically patterned templates with mismatched symmetry -: art. no. 036104 [J].
Daoulas, KC ;
Müller, M ;
Stoykovich, MP ;
Park, SM ;
Papakonstantopoulos, YJ ;
de Pablo, JJ ;
Nealey, PF ;
Solak, HH .
PHYSICAL REVIEW LETTERS, 2006, 96 (03)
[7]   Directed copolymer assembly on chemical substrate patterns:: A phenomenological and single-chain-in-mean-field simulations study of the influence of roughness in the substrate pattern [J].
Daoulas, Kostas Ch. ;
Mueller, Marcus ;
Stoykovich, Mark P. ;
Kang, Huiman ;
de Pablo, Juan J. ;
Nealey, Paul F. .
LANGMUIR, 2008, 24 (04) :1284-1295
[8]   Monte Carlo simulations of a coarse grain model for block copolymers and nanocomposites [J].
Detcheverry, Francois A. ;
Kang, Huiman ;
Daoulas, Kostas Ch. ;
Mueller, Marcus ;
Nealey, Paul F. ;
de Pablo, Juan J. .
MACROMOLECULES, 2008, 41 (13) :4989-5001
[9]   Dimensions and shapes of block copolymer domains assembled on lithographically defined chemically patterned substrates [J].
Edwards, Erik W. ;
Mueller, Marcus ;
Stoykovich, Mark P. ;
Solak, Harun H. ;
de Pablo, Juan J. ;
Nealey, Paul F. .
MACROMOLECULES, 2007, 40 (01) :90-96
[10]   Precise control over molecular dimensions of block-copolymer domains using the interfacial energy of chemically nanopatterned substrates [J].
Edwards, EW ;
Montague, MF ;
Solak, HH ;
Hawker, CJ ;
Nealey, PF .
ADVANCED MATERIALS, 2004, 16 (15) :1315-+