Phase-sensitive frequency-multiplexed optical low-coherence reflectometery

被引：15

作者：

Davé, DP ^{[1
]}

Akkin, T ^{[1
]}

Milner, TE ^{[1
]}

Rylander, HG ^{[1
]}

机构：

[1] Univ Texas, Dept Elect & Comp Engn, Austin, TX 78712 USA

来源：

OPTICS COMMUNICATIONS | 2001年 / 193卷 / 1-6期

基金：

美国国家卫生研究院;

关键词：

low-coherence reflectometer; polarization maintaining fiber; phase measurement; multiplexing;

D O I：

10.1016/S0030-4018(01)01195-6

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We describe a fast phase-sensitive frequency-multiplexed optical low-coherence reflectometer which is capable on measuring optical path-length changes on the order of a few nanometers (similar to5 nm). Results are presented that demonstrate phase sensitivity and frequency multiplexing capability of the interferometer. (C) 2001 Elsevier Science B.V. All rights reserved.

引用

页码：39 / 43

页数：5

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