共 9 条
- [1] Recent developments of the RBS technique for the analysis of semiconductor nanostructures [J]. MICROSCOPY MICROANALYSIS MICROSTRUCTURES, 1995, 6 (5-6): : 505 - 511
- [4] DISLOCATION-FREE STRANSKI-KRASTANOW GROWTH OF GE ON SI(100) [J]. PHYSICAL REVIEW LETTERS, 1990, 64 (16) : 1943 - 1946
- [6] *MARC AN RES CORP, 1992, US INF MAN, VA