Preparation of SrBi2Ta2O9 thin films by metalorganic chemical vapor deposition from two new liquid organometallic sources

被引:32
作者
Funakubo, H [1 ]
Nukaga, N [1 ]
Ishikawa, K [1 ]
Watanabe, T [1 ]
机构
[1] Tokyo Inst Technol, Dept Innovat & Engineered Mat, Interdisciplinary Grad Sch, Midori Ku, Yokohama, Kanagawa 2268502, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS | 1999年 / 38卷 / 2B期
关键词
strontium barium tantalum oxide; trimethyl bismuth; strontium bis-hexaethoxy tantalate; metalorganic chemical vapor deposition;
D O I
10.1143/JJAP.38.L199
中图分类号
O59 [应用物理学];
学科分类号
摘要
SrBi2Ta2O9 thin films were prepared with high compositional reproducibility by metaloganic chemical vapor deposition (MOCVD) using Bi(CH3)(3), Sr[Ta(O . C2H5)(6)](2) and O-2 as source materials. When the deposition temperature was increased, the Bi/Ta and Sr/Ta ratios in the film increased and decreased, respectively. This behavior can be estimated from the deposition temperature dependence of Bi2O3 and Sr-Ta-O films deposited from Bi(CH3)(3)-O-2 and Sr[Ta(O . C2H5)(6)](2)-O-2 systems, respec tively. Bi/Ta ratio can be controlled by the input gas concentration ratio of Bi(CH3)(3) to Sr[Ta(O . C2H5)(6)](2) at 600 degrees C. On the other hand, Sr/Ta ratio was independent of the input gas concentration. An almost single phase of SrBi2Ta2O9 was deposited at 670 degrees C. The remanent polarization and the coercive field of the film deposited at 670 degrees C following heat treatment at 750 degrees C for 30 min in O-2 atmosphere were 5.0 mu C/cm(2) and 80 kV/cm, respectively.
引用
收藏
页码:L199 / L201
页数:3
相关论文
共 16 条
[1]   Preparation and properties of ferroelectric Bi2SrTa2O9 thin films for FeRAM using flash-MOCVD [J].
Ami, T ;
Hironaka, K ;
Isobe, C ;
Nagel, N ;
Sugiyama, M ;
Ikeda, Y ;
Watanabe, K ;
Machida, A ;
Miura, K ;
Tanaka, M .
METAL-ORGANIC CHEMICAL VAPOR DEPOSITION OF ELECTRONIC CERAMICS II, 1996, 415 :195-200
[2]   PREPARATION OF BI-BASED FERROELECTRIC THIN-FILMS BY SOL-GEL METHOD [J].
ATSUKI, T ;
SOYAMA, N ;
YONEZAWA, T ;
OGI, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1995, 34 (9B) :5096-5099
[3]  
BUSKIRK PCV, 1996, JPN J APPL PHYS, V35, P2520
[4]   FATIGUE-FREE FERROELECTRIC CAPACITORS WITH PLATINUM-ELECTRODES [J].
DEARAUJO, CAP ;
CUCHIARO, JD ;
MCMILLAN, LD ;
SCOTT, MC ;
SCOTT, JF .
NATURE, 1995, 374 (6523) :627-629
[5]   Residual strain and crystal structure of BaTiO3-SrTiO3 thin films prepared by metal organic chemical vapor deposition [J].
Funakubo, H ;
Nagano, D ;
Saiki, A ;
Inagaki, Y ;
Shinozaki, K ;
Mizutani, N .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (9B) :5879-5884
[6]  
FUNAKUBO H, 1994, J CHEM VAPOR DEP, V1, P218
[7]   The microstructure of SrBi2Ta2O9 films [J].
Gutleben, CD ;
Ikeda, Y ;
Isobe, C ;
Machida, A ;
Ami, T ;
Hironaka, K ;
Morita, E .
METAL-ORGANIC CHEMICAL VAPOR DEPOSITION OF ELECTRONIC CERAMICS II, 1996, 415 :201-206
[8]   MOCVD of SrBi2Ta2O9 for integrated ferroelectric capacitors [J].
Hendrix, BC ;
Hintermaier, F ;
Desrochers, DA ;
Roeder, JF ;
Bhandari, G ;
Chappuis, M ;
Baum, TH ;
Van Buskirk, PC ;
Dehm, C ;
Fritsch, E ;
Nagel, N ;
Honlein, W ;
Mazure, C .
FERROELECTRIC THIN FILMS VI, 1998, 493 :225-230
[9]   Characteristics of ferroelectric SrBi2Ta2O9 thin films grown by ''Flash'' MOCVD [J].
Isobe, C ;
Ami, T ;
Hironaka, K ;
Watanabe, K ;
Sugiyama, M ;
Nagel, N ;
Katori, K ;
Ikeda, Y ;
Gutleben, CD ;
Tanaka, M ;
Yamoto, H ;
Yagi, H .
INTEGRATED FERROELECTRICS, 1997, 14 (1-4) :95-103
[10]   Measurements of vapor pressures of MOCVD materials, which are usable for ferroelectric thin films. [J].
Kojima, Y ;
Kadokura, H ;
Okuhara, Y ;
Matsumoto, M ;
Mogi, T .
INTEGRATED FERROELECTRICS, 1997, 18 (1-4) :183-195