Stability of a-Si:H prepared by hot-wire and glow discharge using H2 dilution evaluated by pulsed laser degradation

被引:12
作者
Hof, C [1 ]
Ziegler, Y [1 ]
Platz, R [1 ]
Wyrsch, N [1 ]
Shah, A [1 ]
机构
[1] Univ Neuchatel, Inst Microtech, CH-2000 Neuchatel, Switzerland
关键词
amorphous silicon; hot-wire; glow discharge; pulsed laser degradation;
D O I
10.1016/S0022-3093(98)00066-0
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The quality of intrinsic amorphous silicon films prepared by different deposition techniques was investigated. For very high frequency glow discharge, both the substrate temperature as well as the hydrogen dilution were varied. These layers were compared to hot wire material produced at comparable temperatures. To study the stability of these films, an optimised degradation method was developed in which a pulsed dye laser was used in combination with a monochromatic steady beam to achieve a relatively fast stabilisation of the light induced degradation. The film quality was monitored by the photoconductivity and by the ambipolar diffusion length from which the material parameter, mu(0)tau(0), was extracted. Taking into account the transport properties after light soaking as well as the optical absorption we concluded that the hot wire material could lead to mon stable solar cells in comparison with plasma enhanced chemical vapor deposition material. (C) 1998 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:287 / 291
页数:5
相关论文
共 9 条
[1]   Mobility lifetime product - A tool for correlating a-Si:H film properties and solar cell performances [J].
Beck, N ;
Wyrsch, N ;
Hof, C ;
Shah, A .
JOURNAL OF APPLIED PHYSICS, 1996, 79 (12) :9361-9368
[2]   ON LIGHT-INDUCED EFFECT IN AMORPHOUS HYDROGENATED SILICON [J].
GUHA, S ;
NARASIMHAN, KL ;
PIETRUSZKO, SM .
JOURNAL OF APPLIED PHYSICS, 1981, 52 (02) :859-860
[3]   SATURATION OF THE DEFECT DENSITY IN HYDROGENATED AMORPHOUS-SILICON BY PULSED-LIGHT SOAKING [J].
HATA, N ;
GANGULY, G ;
WAGNER, S ;
MATSUDA, A .
APPLIED PHYSICS LETTERS, 1992, 61 (15) :1817-1819
[4]  
KOCKA J, 1994, P 24 IEEE PHOT SPEC
[5]   ORIGINS OF ATMOSPHERIC CONTAMINATION IN AMORPHOUS-SILICON PREPARED BY VERY HIGH-FREQUENCY (70 MHZ) GLOW-DISCHARGE [J].
KROLL, U ;
MEIER, J ;
KEPPNER, H ;
SHAH, A ;
LITTLEWOOD, SD ;
KELLY, IE ;
GIANNOULES, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1995, 13 (06) :2742-2746
[6]   STEADY-STATE PHOTOCARRIER GRATING TECHNIQUE FOR DIFFUSION LENGTH MEASUREMENT IN PHOTOCONDUCTIVE INSULATORS [J].
RITTER, D ;
ZELDOV, E ;
WEISER, K .
APPLIED PHYSICS LETTERS, 1986, 49 (13) :791-793
[7]   Free carrier ambipolar diffusion length in amorphous semiconductors [J].
Shah, A ;
Sauvain, E ;
Hubin, J ;
Pipoz, P ;
Hof, C .
PHILOSOPHICAL MAGAZINE B-PHYSICS OF CONDENSED MATTER STATISTICAL MECHANICS ELECTRONIC OPTICAL AND MAGNETIC PROPERTIES, 1997, 75 (06) :925-936
[8]  
SHUGAR DS, 1994, P 24 IEEE PVSC
[9]   PULSED-LIGHT SOAKING OF HYDROGENATED AMORPHOUS-SILICON [J].
STUTZMANN, M ;
ROSSI, MC ;
BRANDT, MS .
PHYSICAL REVIEW B, 1994, 50 (16) :11592-11605