Electrical properties of compacted assembly of copper oxide nanoparticles

被引：40

作者：

Bose, A ^{[1
]}

Basu, S

Banerjee, S

Chakravorty, D

机构：

[1] Indian Assoc Cultivat Sci, Unit Nano Sci & Technol, Kolkata 700032, W Bengal, India

[2] Univ Calcutta, Dept Phys, Kolkata 700009, W Bengal, India

来源：

JOURNAL OF APPLIED PHYSICS | 2005年 / 98卷 / 07期

关键词：

D O I：

10.1063/1.2084311

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

Cu2O nanoparticles with diameters in the range 6.0-8.6 nm were prepared by a chemical method. Both dc and ac electrical properties were measured on a compacted nanoparticle assembly. dc electrical resistivity in the temperature range 140-300 K was found to arise due to a variable range hopping conduction mechanism. The ac resistivity variation as a function of frequency (in the range 10 kHz to 3 MHz) and temperature (range 220-320 K) was explained on the basis of the power-law exponent in percolating clusters. The interfacial amorphous phase of the nanoparticle assembly appears to control the electrical behavior of the system. (c) 2005 American Institute of Physics.

引用

页数：5

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