A seven-junction electron pump: Design, fabrication, and operation

被引:29
作者
Keller, MW [1 ]
Martinis, JM [1 ]
Steinbach, AH [1 ]
Zimmerman, NM [1 ]
机构
[1] NIST,GAITHERSBURG,MD 20899
关键词
D O I
10.1109/19.571841
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a seven-junction electron pump for use in a new standard of capacitance based on measuring the voltage produced when a known charge is placed on a capacitor, This new pump,,with an error per pumped electron of 15x10(-9), is about 30 times more accurate than a five-junction pump made previously at NIST, By careful design of the pump geometry, we have reduced the effect of cross capacitance and simplified device operation. Our fabrication recipe produces small, stable tunnel junctions relatively quickly and reliably, We have developed a method of tuning the pump for highly accurate electron counting, This tuning can be quickly repeated whenever fluctuations in background charges degrade accuracy.
引用
收藏
页码:307 / 310
页数:4
相关论文
共 11 条
  • [1] APPLICATION OF SINGLE-ELECTRON TUNNELING - PRECISION CAPACITANCE RATIO MEASUREMENTS
    CLARK, AF
    ZIMMERMAN, NM
    WILLIAMS, ER
    AMAR, A
    SONG, D
    WELLSTOOD, FC
    LOBB, CJ
    SOULEN, RJ
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (19) : 2588 - 2590
  • [2] OFFSET MASKS FOR LIFT-OFF PHOTOPROCESSING
    DOLAN, GJ
    [J]. APPLIED PHYSICS LETTERS, 1977, 31 (05) : 337 - 339
  • [3] Grabert H., 1992, Single Charge Tunneling
  • [4] FABRICATION AND CHARACTERIZATION OF SINGLE-ELECTRON TRANSISTORS AND TRAPS
    JI, L
    DRESSELHAUS, PD
    HAN, SY
    LIN, K
    ZHENG, W
    LUKENS, JE
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (06): : 3619 - 3622
  • [5] Accuracy of electron counting using a 7-junction electron pump
    Keller, MW
    Martinis, JM
    Zimmerman, NM
    Steinbach, AH
    [J]. APPLIED PHYSICS LETTERS, 1996, 69 (12) : 1804 - 1806
  • [6] EXPERIMENTAL TESTS FOR THE QUANTUM BEHAVIOR OF A MACROSCOPIC DEGREE OF FREEDOM - THE PHASE DIFFERENCE ACROSS A JOSEPHSON JUNCTION
    MARTINIS, JM
    DEVORET, MH
    CLARKE, J
    [J]. PHYSICAL REVIEW B, 1987, 35 (10): : 4682 - 4698
  • [7] METROLOGICAL ACCURACY OF THE ELECTRON PUMP
    MARTINIS, JM
    NAHUM, M
    JENSEN, HD
    [J]. PHYSICAL REVIEW LETTERS, 1994, 72 (06) : 904 - 907
  • [8] SINGLE-ELECTRON PUMP BASED ON CHARGING EFFECTS
    POTHIER, H
    LAFARGE, P
    URBINA, C
    ESTEVE, D
    DEVORET, MH
    [J]. EUROPHYSICS LETTERS, 1992, 17 (03): : 249 - 254
  • [9] MEASURING THE ELECTRONS CHARGE AND THE FINE-STRUCTURE CONSTANT BY COUNTING ELECTRONS ON A CAPACITOR
    WILLIAMS, ER
    GHOSH, RN
    MARTINIS, JM
    [J]. JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 1992, 97 (02) : 299 - 304
  • [10] Capacitors with very low loss: Cryogenic vacuum-gap capacitors
    Zimmerman, NM
    [J]. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1996, 45 (05) : 841 - 846