Twinned epitaxial layers formed on Si(111)√3x√3-B

被引:29
作者
Hibino, H [1 ]
Sumitomo, K [1 ]
Ogino, T [1 ]
机构
[1] NTT, Basic Res Labs, Atsugi, Kanagawa 24301, Japan
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS | 1998年 / 16卷 / 03期
关键词
D O I
10.1116/1.581199
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We investigate the growth process of twinned epitaxial Si layers on Si(111)root 3X root 3-B and their thermal stability. In the initial growth stages, twinned two-bilayer-high (2-BL-high) and untwinned BL-high islands are formed, and at higher surface B concentration, there are more twinned 2BL islands than untwinned BL islands. Domain boundaries of the root 3X root 3 reconstruction act as preferential island nucleation sites, especially for untwinned BL islands. Therefore, to grow epitaxial layers twinned with the already-grown twinned layers, post-growth anneal is essential to increase the surface B concentration and to reduce the domain boundary density. On the other hand, the temperature at which twinned layers are transformed into untwinned layers strongly depends on the thickness. We demonstrate the possibility of growing superlattices of layers that have twinned and untwinned orientations with the substrate (polytypes) by precisely controlling the growth and post-growth anneal parameters. (C) 1998 American Vacuum Society.
引用
收藏
页码:1934 / 1937
页数:4
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