Effective dielectric function of mixtures of three or more materials:: a numerical procedure for computations

被引：70

作者：

Bosch, S

Ferré-Borrull, J

Leinfellner, N

Canillas, A

机构：

[1] Univ Barcelona, Dept Fis Aplicada & Opt, E-08028 Barcelona, Spain

[2] Fraunhofer Inst Appl Opt & Precis Engn, D-07745 Jena, Germany

来源：

SURFACE SCIENCE | 2000年 / 453卷 / 1-3期

关键词：

dielectric phenomena; ellipsometry; reflection spectroscopy; surface structure; morphology; roughness; and topography;

D O I：

10.1016/S0039-6028(00)00354-X

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

A numerical procedure for solving the mathematical equations that define the effective medium for a mixture of materials is presented. The basic idea is to transform the inherent complex root-finding problem into a minimization task in real space so that the method can be implemented through a standard two-dimensional minimization algorithm. This leads to general, simple and useful procedures for ellipsometric and/or spectrophotometric data analysis in the optical characterization of materials and surfaces. (C) 2000 Elsevier Science B.V. All rights reserved.

引用

页码：9 / 17

页数：9

共 11 条

[1]

Aspnes D. E., 1981, Proceedings of the Society of Photo-Optical Instrumentation Engineers, V276, P188

[2] INVESTIGATION OF EFFECTIVE-MEDIUM MODELS OF MICROSCOPIC SURFACE-ROUGHNESS BY SPECTROSCOPIC ELLIPSOMETRY [J].