Radio frequency magnetron sputter-deposited indium tin oxide for use as a cathode in transparent organic light-emitting diode

被引:44
作者
Chung, CH [1 ]
Ko, YW [1 ]
Kim, YH [1 ]
Sohn, CY [1 ]
Chu, HY [1 ]
Park, SHK [1 ]
Lee, JH [1 ]
机构
[1] ETRI, Basic Res Lab, Taejon 305350, South Korea
关键词
indium tin oxide; sputtering; electrical properties and measurements; transparent organic light-emitting diode;
D O I
10.1016/j.tsf.2005.06.003
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Indium tin oxide (ITO) films were prepared by radio frequency magnetron sputtering at room temperature, for use as a cathode in a transparent organic light-emitting diode (TOLED). To minimize damage to the TOLED by the ITO sputtering process, the target-to-substrate distance was increased to 20 cm. An ITO film deposited at the optimum oxygen partial pressure exhibited an electrical resistivity as low as 4.06 x 10(-4) ohm cm and a high optical transmittance of 91% in the visible range. The film was used as a transparent cathode for a TOLED with structure of an ITO coated glass substrate /Naphthylphenyldiamide (60 nm)/Tris-(8-hydroxyquinoline) aluminum (60 nm)/LiF (1 nm)/Al (2 nm)/Ag (8 nm)/ITO cathode (100 nm). A maximum luminance of 37,000 cd/m(2) was obtained. The device performance was comparable to a conventional OLED. (c) 2005 Elsevier B.V All rights reserved.
引用
收藏
页码:294 / 297
页数:4
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