Deep-ultraviolet emission of AlGaN/AlN quantum wells on bulk AlN

被引:65
作者
Gaska, R
Chen, C
Yang, J
Kuokstis, E
Khan, A
Tamulaitis, G
Yilmaz, I
Shur, MS
Rojo, JC
Schowalter, LJ
机构
[1] Sensor Elect Technol Inc, Columbia, SC 29209 USA
[2] Univ S Carolina, Dept EE, Columbia, SC 29208 USA
[3] Rensselaer Polytech Inst, Dept ECE & CIE, Troy, NY 12180 USA
[4] Crystal IS Inc, Latham, NY 12110 USA
[5] Vilnius Univ, IMSAR, Vilnius, Lithuania
关键词
D O I
10.1063/1.1524034
中图分类号
O59 [应用物理学];
学科分类号
摘要
An approach for growing high-quality AlGaN/AlN multiple quantum wells (MQW) emitting in deep UV region is proposed. The structures are deposited on bulk AlN substrates. Structural analysis by using x-ray diffraction confirms high crystalline quality of these structures. Photoluminescence dependences on excitation intensity and temperature under band-to-band excitation of AlN barrier layers and under selective excitation of the quantum wells are presented. Al0.5Ga0.5N/AlN MQW grown on bulk AlN demonstrate emission at 260 nm with high emission intensity. Stimulated emission of these structures at 258 nm was observed. The results prove great potential of growing structures with high-aluminum-content layers on bulk AlN substrates. (C) 2002 American Institute of Physics.
引用
收藏
页码:4658 / 4660
页数:3
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