Strong influence of Ga/N flux ratio on Mn incorporation into Ga1-xMnxN epilayers grown by plasma-assisted molecular beam epitaxy

被引:43
作者
Kuroda, S
Bellet-Amalric, E
Giraud, R
Marcet, S
Cibert, J
Mariette, H
机构
[1] Univ Grenoble 1, Spectrometrie Phys Lab, CEA CNRS Grp, F-38054 Grenoble 9, France
[2] CEA Grenoble, SP2M, Dept Rech Fondamentale Mat Condensee, F-38054 Grenoble, France
[3] Univ Tsukuba, Inst Mat Sci, Tsukuba, Ibaraki 3058573, Japan
关键词
D O I
10.1063/1.1629791
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report the growth of Mn-doped wurtzite GaN epilayers by nitrogen plasma-assisted molecular beam epitaxy, with a systematic attention to the dependence on the growth conditions. The addition of Mn modifies the growth diagram related to the Ga/N flux ratio. In particular, the stable Ga-bilayer coverage on the growth surface for the Ga-rich condition is destabilized in the presence of Mn. Mn incorporation in the epilayers is found to strongly depend on the Ga/N flux ratio: it varies by two orders of magnitude between the Ga-rich and the N-rich growth conditions. X-ray diffraction measurements on epilayers grown in the stoichiometric condition reveal a clear contrast between the precipitation of perovskite GaMn3N clusters at Mn compositions higher than 1.7%, and the single phase of wurtzite Ga1-xMnxN at lower Mn compositions. (C) 2003 American Institute of Physics.
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页码:4580 / 4582
页数:3
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