Proportional difference operator method and its application in studying subthreshold behavior of MOSFETs

被引:7
作者
Tan, CH [1 ]
Xu, MZ [1 ]
Wang, Z [1 ]
机构
[1] Peking Univ, Inst Microelect, Dept Comp Sci & Technol, Beijing 100871, Peoples R China
关键词
D O I
10.1016/S0038-1101(99)00318-4
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The proportional difference operator (PDO) method is presented to study the subthreshold behavior of MOSFETs. By applying the PDO, acting on an expression for the drain current in the subthreshold region, a new proportional difference characteristic of MOSFET can be obtained. The analytical results show that the proportional difference of the subthreshold equation is a peak function. Its peak position, being dependent on the measurement voltage, is related to the characteristic parameters, so the most important parameters (such as thermal and threshold voltages) can be easily obtained. A surface potential approximation has been developed and implemented in studying a MOSFET's proportional difference subthreshold behaviors. The relationships between the classical threshold voltage and the Lindner threshold voltage are also discussed. Values of voltage constants are shown to agree well with those obtained by standard methods. (C) 2000 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码:1059 / 1067
页数:9
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