Luminescence and Raman characterization of molecular and nanocrystalline silicon clusters

被引：16

作者：

Guyot, Y ^{[1
]}

Champagnon, B ^{[1
]}

Boudeulle, M ^{[1
]}

Melinon, P ^{[1
]}

Prevel, B ^{[1
]}

Dupuis, V ^{[1
]}

Perez, A ^{[1
]}

机构：

[1] UNIV LYON 1,DPM,UMR 5586,F-69622 VILLEURBANNE,FRANCE

来源：

THIN SOLID FILMS | 1997年 / 297卷 / 1-2期

关键词：

luminescence; Raman scattering; nanostructures; silicon; clusters;

D O I：

10.1016/S0040-6090(96)09426-6

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

Silicon clusters prepared by low energy cluster beam deposition exhibit visible luminescence similar to that observed in porous silicon. The structure and properties are characterized by different complementary techniques with a special emphasis on Raman spectroscopy. The comparison with silicon clathrates structures is promising. The validity of the confinement model in a size range down to a few angstroms is discussed. (C) 1997 Elsevier Science S.A.

引用

页码：188 / 191

页数：4

共 14 条

[1] WIDE-BAND-GAP SI IN OPEN FOURFOLD-COORDINATED CLATHRATE STRUCTURES [J].