Optimization of the as-deposited 1.54 μm photoluminescence intensity in a-SiOx:H⟨Er⟩

被引:12
作者
Tessler, LR [1 ]
Iñiguez, AC [1 ]
机构
[1] Univ Estadual Campinas, Inst Fis Gleb Wataghin, BR-13083970 Campinas, SP, Brazil
关键词
D O I
10.1016/S0022-3093(99)00751-6
中图分类号
TQ174 [陶瓷工业]; TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Erbium-doped a-Si:H has Er3+-related photoluminescence (PL) at similar to 1.54 mu m (similar to 0.8 eV). This emission is an intra-4f level transition of the Er3+ ion: which can be increased by adding O. In this paper we present a study of the dependence of the Er3+ luminescence on Er and O concentration ([Er] and [O]) in a-SiOx:H. Samples were prepared by rf-sputtering from a Si target partially covered by small erbium platelets in an Ar + H-2 + O-2 plasma. The maximum Er3+ luminescence occurs when 10 less than or equal to [O]/[Er] less than or equal to 40. Up to 3 O atoms form the Er coordination shell. The extra O increases the excitation of the Er3+ ions. When [O] increases and the density of states at mid-gap becomes larger than [Er], the Er3+ excitation rate decreases. In optimized samples the temperature quenching is less than a factor 2 from 15 to 300 K. The data allow us to conclude that: (a) Efficient room temperature Er3+ PL can be obtained from as-deposited a-SiOx:H(Er). (b) The role of O in a-SiOx:H(Er) is more than just providing non-centrosymmetric environments for Er3+. It also increases the Er3+ excitation rate. (C) 2000 Elsevier Science B.V. All rights reserved.
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页码:603 / 607
页数:5
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