Tip-sample distance feedback control in a scanning evanescent microwave probe for nonlinear dielectric imaging

被引：9

作者：

Duewer, F ^{[1
]}

Gao, C ^{[1
]}

Xiang, XD ^{[1
]}

机构：

[1] Lawrence Berkeley Lab, Environm Energies Technol Div, Berkeley, CA 94720 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2000年 / 71卷 / 06期

关键词：

D O I：

10.1063/1.1150629

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We implemented tip-sample distance control in a scanning evanescent microwave probe for nonlinear dielectric microscopy. With the analytic expression of the tip-sample capacitance as a function of tip-sample distance, we can quantitatively regulate the tip-sample separation and independently measure the dielectric nonlinearity by application of an ac bias voltage. Simultaneous imaging of topography and ferroelectric domains has been demonstrated on periodically poled LiNbO3 single crystals. (C) 2000 American Institute of Physics. [S0034-6748(00)05406-X].

引用

页码：2414 / 2417

页数：4

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