Effect of deposition angle on fiber axis tilt in sputtered aluminum nitride and pure metal films

被引:20
作者
Dellas, N. S. [1 ]
Harper, J. M. E. [1 ]
机构
[1] Univ New Hampshire, Dept Phys, Durham, NH 03824 USA
基金
美国国家科学基金会;
关键词
aluminum; nitride; deposition process; niobium; silver; sputtering; X-ray diffraction;
D O I
10.1016/j.tsf.2006.05.039
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
We show that the fiber axis orientation in sputtered aluminum nitride (AlN) responds strongly to deposition angle as compared with pure metal films. Fiber axis tilt was measured in films deposited at angles from 0 degrees to 68 degrees from the substrate normal. For pure metal films of Al and Ag, the strong (111) texture has a fiber axis tilt of < 10 degrees from the substrate normal. For pure Nb films, the strong (110) texture also has a tilt of < 10 degrees. In contrast, for films of the compound AlN, the distinct c-axis texture responds strongly to the deposition direction, with the fiber axis tilt almost following the deposition angle. (c) 2006 Elsevier B.V. All rights reserved.
引用
收藏
页码:1647 / 1650
页数:4
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