Manipulation of graphene within a scanning force microscope

被引：9

作者：

Eilers, Stefan ^{[1
]}

Rabe, Juergen P. ^{[1
]}

机构：

[1] Humboldt Univ, Inst Phys, D-12489 Berlin, Germany

来源：

PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS | 2009年 / 246卷 / 11-12期

关键词：

D O I：

10.1002/pssb.200982350

中图分类号：

O469 [凝聚态物理学];

学科分类号：

070205 ;

摘要：

We manipulated mono- and bi-layers of graphene on oxidized silicon wafers with a scanning force microscope (SFM). Two principle effects were observed and analyzed: (1) Cutting graphene and thereby producing ribbons, and (2) turning graphene upside down. Both are attributed to the intrinsic properties of graphenes and their interaction with the underlying substrate. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

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页码：2527 / 2529

页数：3

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