On maximizing the coverage of catastrophic and parametric faults

被引：3

作者：

Brosa, AM ^{[1
]}

Figueras, J ^{[1
]}

机构：

[1] Univ Politecn Cataluna, DEE, E-08028 Barcelona, Spain

来源：

JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS | 2000年 / 16卷 / 03期

关键词：

analog & mixed-signal testing; fault coverage; set covering problems;

D O I：

10.1023/A:1008395416045

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

The purpose of th is paper is to analyze an optimization method to improve the testability of structural and parametric faults in analog circuits. The approach consists of finding an optimum sub-set of tests which maximizes the fault coverage with minimum cost. The method is based on covering a discrete set of intervals by taking advantage of strategies effectively used in digital synthesis. A simple application example is given to illustrate the proposal by studying the fault coverage obtained using different test sets on the ITC97 benchmark op-amp.

引用

页码：251 / 258

页数：8

共 18 条

[1]

BROSA AM, 1998, P EUR TEST WORKSH ET

[2] ELECTRICAL MODEL OF THE FLOATING-GATE DEFECT IN CMOS ICS - IMPLICATIONS ON IDDQ TESTING [J].