Definition of a simple resolution criterion in an Apertureless Scanning Near-Field Optical Microscope (A-SNOM): contribution of the tip vibration and lock-in detection

被引：6

作者：

Bijeon, JL ^{[1
]}

Adam, PM ^{[1
]}

Barchiesi, D ^{[1
]}

Royer, P ^{[1
]}

机构：

[1] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, F-10010 Troyes, France

来源：

EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS | 2004年 / 26卷 / 01期

关键词：

D O I：

10.1051/epjap:2004021

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

A realistic near-field calculation on metallic hole samples in illumination transmission conditions predicts certain light confinements around the holes. The purpose of this paper is to explain theoretically how an A-SNOM (Apertureless Scanning Near-field Optical Microscope) is able to detect the light confinement around the holes, and how it is possible, by defining a criterion of separation between two holes in near-field, to analyse the resolution as a function of the experimental parameters. The modulation of the probe height in A-SNOM is used for both distance control and separation of the near-field from the background scattered light. A realistic model of lock-in detection is used to calculate the images of test samples. Constant height mode images are presented at different amplitudes of probe modulation and average heights of the tip. We also discuss the detection at different demodulation harmonics.

引用

页码：45 / 52

页数：8

共 33 条

[1] Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast [J].

Adam, PM ;

Royer, P ;

Laddada, R ;

Bijeon, JL .

APPLIED OPTICS, 1998, 37 (10) :1814-1819

[2] Analysis of the influence of the tip vibration in the formation of images in apertureless scanning near-field optical microscopy [J].

Adam, PM ;

Bijeon, JL ;

Viardot, G ;

Royer, P .

OPTICS COMMUNICATIONS, 2000, 174 (1-4) :91-98

[3] INTERACTION OF ELECTROMAGNETIC-WAVES AT ROUGH DIELECTRIC SURFACES [J].

AGARWAL, GS .

PHYSICAL REVIEW B, 1977, 15 (04) :2371-2383

[4]

[Anonymous], PROCEDURES SCANNING

[5] SUPER-RESOLUTION APERTURE SCANNING MICROSCOPE [J].

ASH, EA ;

NICHOLLS, G .

NATURE, 1972, 237 (5357) :510-&

[6] NEAR-FIELD OPTICAL MICROSCOPE BASED ON LOCAL PERTURBATION OF A DIFFRACTION SPOT [J].

BACHELOT, R ;

GLEYZES, P ;

BOCCARA, AC .

OPTICS LETTERS, 1995, 20 (18) :1924-1926

[7] Near-field surface plasmon microscopy: A numerical study of plasmon excitation, propagation, and edge interaction using a three-dimensional Gaussian beam [J].

Baida, FI ;

Van Labeke, D ;

Vigoureux, JM .

PHYSICAL REVIEW B, 1999, 60 (11) :7812-7815

[8] Comparison of test images obtained from various configurations of scanning near-field optical microscopes [J].

Bainier, C ;

Vannier, C ;

Courjon, D ;

Rivoal, JC ;

Ducourtieux, S ;

De Wilde, Y ;

Aigouy, L ;

Formanek, F ;

Belliard, L ;

Siry, P ;

Perrin, B .

APPLIED OPTICS, 2003, 42 (04) :691-700

[9] Computing the optical near-field distributions around complex subwavelength surface structures: A comparative study of different methods [J].

Barchiesi, D ;

Girard, C ;

Martin, OJF ;

VanLabeke, D ;

Courjon, D .

PHYSICAL REVIEW E, 1996, 54 (04) :4285-4292

[10] A 3-D multilayer model of scattering by nanostructures. Application to the optimisation of thin coated nano-sources [J].

Barchiesi, D .

OPTICS COMMUNICATIONS, 1996, 126 (1-3) :7-13

← 1 2 3 4 →