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Hysteretic bipolar resistive switching characteristics in TiO2/TiO2-x multilayer homojunctions
被引:63
作者:

Do, Young Ho
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Kwak, June Sik
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Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Bae, Yoon Cheol
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Hanyang Univ, Div Nanosemicond Engn, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Jung, Kyooho
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Dongguk Univ, Dept Semicond Sci, Seoul 100715, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Im, Hyunsik
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Dongguk Univ, Dept Semicond Sci, Seoul 100715, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

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机构:
[1] Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
[2] Hanyang Univ, Div Nanosemicond Engn, Seoul 133791, South Korea
[3] Dongguk Univ, Dept Semicond Sci, Seoul 100715, South Korea
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D O I:
10.1063/1.3224179
中图分类号:
O59 [应用物理学];
学科分类号:
摘要:
TiO2 (oxygen rich, region 1)/TiO2-x (oxygen poor, region 2) multilayer homojunctions were studied as alternative resistive switching structures for both high and low resistance transitions. Stable bipolar resistive switching characteristics, including stable switching speeds microseconds) and endurance behaviors, as well as long retention times (>10(4) s) were demonstrated. The nature of the resistive switching phenomenon in multilayer structures seems to be a combination of the conduction path and the redox reaction, resulting from the oxygen ions drifting between the oxygen rich and poor regions of the multilayer structures. A possible conduction sketch for bipolar switching behaviors is also discussed. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3224179]
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共 13 条
[1]
Reproducible switching effect in thin oxide films for memory applications
[J].
Beck, A
;
Bednorz, JG
;
Gerber, C
;
Rossel, C
;
Widmer, D
.
APPLIED PHYSICS LETTERS,
2000, 77 (01)
:139-141

Beck, A
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Bednorz, JG
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Gerber, C
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Rossel, C
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland

Widmer, D
论文数: 0 引用数: 0
h-index: 0
机构:
IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland IBM Corp, Res, Zurich Res Lab, CH-8803 Ruschlikon, Switzerland
[2]
Resistive switching mechanism of TiO2 thin films grown by atomic-layer deposition -: art. no. 033715
[J].
Choi, BJ
;
Jeong, DS
;
Kim, SK
;
Rohde, C
;
Choi, S
;
Oh, JH
;
Kim, HJ
;
Hwang, CS
;
Szot, K
;
Waser, R
;
Reichenberg, B
;
Tiedke, S
.
JOURNAL OF APPLIED PHYSICS,
2005, 98 (03)

Choi, BJ
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Jeong, DS
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Kim, SK
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Rohde, C
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Choi, S
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Oh, JH
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Kim, HJ
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Hwang, CS
论文数: 0 引用数: 0
h-index: 0
机构:
Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Szot, K
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Waser, R
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Reichenberg, B
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea

Tiedke, S
论文数: 0 引用数: 0
h-index: 0
机构: Seoul Natl Univ, Sch Mat Sci & Engn, Seoul 151742, South Korea
[3]
Al electrode dependent transition to bipolar resistive switching characteristics in pure TiO2 films
[J].
Do, Young Ho
;
Kwak, June Sik
;
Hong, Jin Pyo
;
Jung, Kyooho
;
Im, Hyunsik
.
JOURNAL OF APPLIED PHYSICS,
2008, 104 (11)

Do, Young Ho
论文数: 0 引用数: 0
h-index: 0
机构:
Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Kwak, June Sik
论文数: 0 引用数: 0
h-index: 0
机构:
Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Hong, Jin Pyo
论文数: 0 引用数: 0
h-index: 0
机构:
Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Jung, Kyooho
论文数: 0 引用数: 0
h-index: 0
机构:
Dongguk Univ, Dept Semicond Sci, Seoul 100715, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea

Im, Hyunsik
论文数: 0 引用数: 0
h-index: 0
机构:
Dongguk Univ, Dept Semicond Sci, Seoul 100715, South Korea Hanyang Univ, Dept Phys, Novel Funct Mat & Devices Lab, Seoul 133791, South Korea
[4]
Hysteretic current-voltage characteristics and resistance switching at an epitaxial oxide Schottky junction SrRuO3/SrTi0.99Nb0.01O3
[J].
Fujii, T
;
Kawasaki, M
;
Sawa, A
;
Akoh, H
;
Kawazoe, Y
;
Tokura, Y
.
APPLIED PHYSICS LETTERS,
2005, 86 (01)
:012107-1

论文数: 引用数:
h-index:
机构:

Kawasaki, M
论文数: 0 引用数: 0
h-index: 0
机构: Natl Inst Adv Ind Sci & Technol, CERC, Tsukuba, Ibaraki 3058562, Japan

Sawa, A
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Adv Ind Sci & Technol, CERC, Tsukuba, Ibaraki 3058562, Japan Natl Inst Adv Ind Sci & Technol, CERC, Tsukuba, Ibaraki 3058562, Japan

Akoh, H
论文数: 0 引用数: 0
h-index: 0
机构: Natl Inst Adv Ind Sci & Technol, CERC, Tsukuba, Ibaraki 3058562, Japan

Kawazoe, Y
论文数: 0 引用数: 0
h-index: 0
机构: Natl Inst Adv Ind Sci & Technol, CERC, Tsukuba, Ibaraki 3058562, Japan

论文数: 引用数:
h-index:
机构:
[5]
Evidence for an oxygen diffusion model for the electric pulse induced resistance change effect in transition-metal oxides
[J].
Nian, Y. B.
;
Strozier, J.
;
Wu, N. J.
;
Chen, X.
;
Ignatiev, A.
.
PHYSICAL REVIEW LETTERS,
2007, 98 (14)

Nian, Y. B.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA

Strozier, J.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA

Wu, N. J.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA

Chen, X.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA

Ignatiev, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA Univ Houston, Ctr Adv Mat, Houston, TX 77204 USA
[6]
Electroforming and resistance-switching mechanism in a magnetite thin film
[J].
Odagawa, A.
;
Katoh, Y.
;
Kanzawa, Y.
;
Wei, Z.
;
Mikawa, T.
;
Muraoka, S.
;
Takagi, T.
.
APPLIED PHYSICS LETTERS,
2007, 91 (13)

Odagawa, A.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Katoh, Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Kanzawa, Y.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Wei, Z.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Mikawa, T.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Muraoka, S.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan

Takagi, T.
论文数: 0 引用数: 0
h-index: 0
机构:
Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan Matsushita Elect ind Co Ltd, Adv Device Dev Ctr, Osaka 570, Japan
[7]
Nonvolatile memory with multilevel switching: A basic model
[J].
Rozenberg, MJ
;
Inoue, IH
;
Sánchez, MJ
.
PHYSICAL REVIEW LETTERS,
2004, 92 (17)
:178302-1

Rozenberg, MJ
论文数: 0 引用数: 0
h-index: 0
机构:
Ecole Polytech, CPHT, F-91128 Palaiseau, France Ecole Polytech, CPHT, F-91128 Palaiseau, France

Inoue, IH
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech, CPHT, F-91128 Palaiseau, France

Sánchez, MJ
论文数: 0 引用数: 0
h-index: 0
机构: Ecole Polytech, CPHT, F-91128 Palaiseau, France
[8]
Hysteretic current-voltage characteristics and resistance switching at a rectifying Ti/Pr0.7Ca0.3MnO3 interface
[J].
Sawa, A
;
Fujii, T
;
Kawasaki, M
;
Tokura, Y
.
APPLIED PHYSICS LETTERS,
2004, 85 (18)
:4073-4075

Sawa, A
论文数: 0 引用数: 0
h-index: 0
机构:
Natl Inst Adv Ind Sci & Technol, Correlated Electron Res Ctr, Tsukuba, Ibaraki 3058562, Japan Natl Inst Adv Ind Sci & Technol, Correlated Electron Res Ctr, Tsukuba, Ibaraki 3058562, Japan

论文数: 引用数:
h-index:
机构:

Kawasaki, M
论文数: 0 引用数: 0
h-index: 0
机构: Natl Inst Adv Ind Sci & Technol, Correlated Electron Res Ctr, Tsukuba, Ibaraki 3058562, Japan

论文数: 引用数:
h-index:
机构:
[9]
The missing memristor found
[J].
Strukov, Dmitri B.
;
Snider, Gregory S.
;
Stewart, Duncan R.
;
Williams, R. Stanley
.
NATURE,
2008, 453 (7191)
:80-83

Strukov, Dmitri B.
论文数: 0 引用数: 0
h-index: 0
机构:
HP Labs, Palo Alto, CA 94304 USA HP Labs, Palo Alto, CA 94304 USA

Snider, Gregory S.
论文数: 0 引用数: 0
h-index: 0
机构:
HP Labs, Palo Alto, CA 94304 USA HP Labs, Palo Alto, CA 94304 USA

Stewart, Duncan R.
论文数: 0 引用数: 0
h-index: 0
机构:
HP Labs, Palo Alto, CA 94304 USA HP Labs, Palo Alto, CA 94304 USA

Williams, R. Stanley
论文数: 0 引用数: 0
h-index: 0
机构:
HP Labs, Palo Alto, CA 94304 USA HP Labs, Palo Alto, CA 94304 USA
[10]
Electronics - The fourth element
[J].
Tour, James M.
;
He, Tao
.
NATURE,
2008, 453 (7191)
:42-43

Tour, James M.
论文数: 0 引用数: 0
h-index: 0
机构:
Rice Univ, Dept Chem, Houston, TX 77005 USA
Rice Univ, Dept Comp Sci, Houston, TX 77005 USA
Rice Univ, Dept Mech Engn, Houston, TX 77005 USA
Rice Univ, Dept Mat Sci, Houston, TX 77005 USA
Rice Univ, Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USA Rice Univ, Dept Chem, Houston, TX 77005 USA

He, Tao
论文数: 0 引用数: 0
h-index: 0
机构:
Rice Univ, Dept Chem, Houston, TX 77005 USA
Rice Univ, Dept Comp Sci, Houston, TX 77005 USA
Rice Univ, Dept Mech Engn, Houston, TX 77005 USA
Rice Univ, Dept Mat Sci, Houston, TX 77005 USA
Rice Univ, Smalley Inst Nanoscale Sci & Technol, Houston, TX 77005 USA Rice Univ, Dept Chem, Houston, TX 77005 USA