A Decade of Step and Flash Imprint Lithography

被引:38
作者
Willson, C. Grant [1 ]
机构
[1] Univ Texas Austin, Dept Chem Engn, Austin, TX 78712 USA
关键词
Step and Flash Imprint Lithography; BEOL; nano-imprint; templates; FABRICATION;
D O I
10.2494/photopolymer.22.147
中图分类号
O63 [高分子化学(高聚物)];
学科分类号
070305 ; 080501 ; 081704 ;
摘要
Step and Flash Imprint Lithography (SFIL) was first reported ten years ago. The technology has advanced in many ways during the last decade. There are sophisticated, imprint tools available from commercial suppliers and high resolution templates can be purchased from several vendors. The materials and the process have evolved and matured to enable printing of sub 10nm structures, inverse tone printing, printing on both sides of disk drive substrates, printing in three dimensions to enable efficient production of CMOS wiring levels and printing of functional materials tailored to enable production of photonic crystals, insulators, etc. While great progress has been made in many areas, there remain concerns among some about defectivity and the throughput of the process.
引用
收藏
页码:147 / 153
页数:7
相关论文
共 22 条
[1]   Step and flash imprint lithography: Template surface treatment and defect analysis [J].
Bailey, T ;
Choi, BJ ;
Colburn, M ;
Meissl, M ;
Shaya, S ;
Ekerdt, JG ;
Sreenivasan, SV ;
Willson, CG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2000, 18 (06) :3572-3577
[2]  
BROOKS C, 2009, P SPIE, V7271
[3]  
CHAO B, 2009, P SPIE, V6921
[4]   Design of orientation stages for step and flash imprint lithography [J].
Choi, BJ ;
Sreenivasan, SV ;
Johnson, S ;
Colburn, M ;
Wilson, CG .
PRECISION ENGINEERING-JOURNAL OF THE INTERNATIONAL SOCIETIES FOR PRECISION ENGINEERING AND NANOTECHNOLOGY, 2001, 25 (03) :192-199
[5]   Ramifications of lubrication theory on imprint lithography [J].
Colburn, M ;
Choi, BJ ;
Sreenivasan, SV ;
Bonnecaze, RT ;
Willson, CG .
MICROELECTRONIC ENGINEERING, 2004, 75 (03) :321-329
[6]   Characterization and modeling of volumetric and mechanical properties for step and flash imprint lithography photopolymers [J].
Colburn, M ;
Suez, I ;
Choi, BJ ;
Meissl, M ;
Bailey, T ;
Sreenivasan, SV ;
Ekerdt, JG ;
Willson, CG .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2001, 19 (06) :2685-2689
[7]   Step and flash imprint lithography: A new approach to high-resolution patterning [J].
Colburn, M ;
Johnson, S ;
Stewart, M ;
Damle, S ;
Bailey, T ;
Choi, B ;
Wedlake, M ;
Michaelson, T ;
Sreenivasan, SV ;
Ekerdt, J ;
Willson, CG .
EMERGING LITHOGRAPHIC TECHNOLOGIES III, PTS 1 AND 2, 1999, 3676 :379-389
[8]  
HERSHEY R, 2006, P SPIE, V6337
[9]  
HOULE FA, 2008, P SPIE, V6921
[10]   Effects of etch barrier densification on step and flash imprint lithography [J].
Johnson, S ;
Burns, R ;
Kim, EK ;
Dickey, M ;
Schmid, G ;
Meiring, J ;
Burns, S ;
Willson, CG ;
Convey, D ;
Wei, Y ;
Fejes, P ;
Gehoski, K ;
Mancini, D ;
Nordquist, K ;
Dauksher, WJ ;
Resnick, DJ .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2005, 23 (06) :2553-2556